Efficient modeling of apertures in thin conducting screens by the TLM method
1999 ◽
Vol 23
(3)
◽
pp. 137-141
◽
Characterization of contact resistance of low-value resistor by transmission line model (TLM) method
2002 ◽
Vol 85
(3)
◽
pp. 16-22
Keyword(s):
1982 ◽
Vol 18
(2)
◽
pp. 447-449
◽