Comprehensive defect analysis and testability of current-mode logic circuits

Author(s):  
S. Adham ◽  
D. Al-Khalili ◽  
C. Rozon ◽  
D. Raez
1996 ◽  
Vol 31 (8) ◽  
pp. 1165-1169 ◽  
Author(s):  
A. Bellaouar ◽  
H. Touzene

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