2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

Mapping Intimacies ◽

10.1109/ipfa53173.2021 ◽

2021 ◽

Keyword(s):

Integrated Circuits ◽

Failure Analysis ◽

International Symposium ◽

Ieee International Symposium

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Introduction to the Special Issue on the 2004 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

IEEE Transactions on Device and Materials Reliability ◽

10.1109/tdmr.2005.849903 ◽

2005 ◽

Vol 5 (2) ◽

pp. 167-167

Author(s):

K.L. Pey ◽

A. Trigg ◽

S. Chung

Keyword(s):

Integrated Circuits ◽

Failure Analysis ◽

International Symposium ◽

Special Issue ◽

Ieee International Symposium

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Expanded Papers from the 2003 IEEE International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)

IEEE Transactions on Electron Devices ◽

10.1109/ted.2004.824990 ◽

2004 ◽

Vol 51 (3) ◽

pp. 518-519

Keyword(s):

Integrated Circuits ◽

Failure Analysis ◽

International Symposium ◽

Ieee International Symposium

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18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

10.1109/ipfa18367.2011 ◽

2011 ◽

Keyword(s):

Integrated Circuits ◽

Failure Analysis ◽

International Symposium ◽

Ieee International Symposium

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2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits

10.1109/ipfa15316.2009 ◽

2009 ◽

Keyword(s):

Integrated Circuits ◽

Failure Analysis ◽

International Symposium ◽

Ieee International Symposium

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2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

10.1109/ipfa49335.2020 ◽

2020 ◽

Keyword(s):

Integrated Circuits ◽

Failure Analysis ◽

International Symposium ◽

Ieee International Symposium

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Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

10.1109/ipfa31912.2013 ◽

2013 ◽

Keyword(s):

Integrated Circuits ◽

Failure Analysis ◽

International Symposium ◽

Ieee International Symposium

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Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

IEEE Transactions on Device and Materials Reliability ◽

10.1109/tdmr.2004.826387 ◽

2004 ◽

Vol 4 (1) ◽

pp. 4-4

Author(s):

K.L. Pey ◽

M.K. Radhakrishnan ◽

A. Trigg

Keyword(s):

Integrated Circuits ◽

Failure Analysis ◽

International Symposium ◽

Ieee International Symposium

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Introduction to the Special Issue on the IEEE International Symposium on Physical and Failure Analysis of Integrated Circuits

IEEE Transactions on Device and Materials Reliability ◽

10.1109/tdmr.2006.877203 ◽

2006 ◽

Vol 6 (2) ◽

pp. 181-181

Author(s):

C.H. Tung ◽

J.M. Chin ◽

S. Lim

Keyword(s):

Integrated Circuits ◽

Failure Analysis ◽

International Symposium ◽

Special Issue ◽

Ieee International Symposium

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2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits

10.1109/ipfa19910.2012 ◽

2012 ◽

Keyword(s):

Integrated Circuits ◽

Failure Analysis ◽

International Symposium ◽

Ieee International Symposium

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11th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2004)

IEEE Transactions on Device and Materials Reliability ◽

10.1109/tdmr.2004.827881 ◽

2004 ◽

Vol 4 (1) ◽

pp. 119-119

Keyword(s):

Integrated Circuits ◽

Failure Analysis ◽

International Symposium ◽

Ieee International Symposium

Download Full-text