Study of reliability degradation in power RF LDMOS under pulsed life test due to impact ionization

2020 ◽  
Author(s):  
M.A. Belaid
Keyword(s):  
Impact Ionization ◽  
Life Test

Study on the Analysis of Failure Cause and Determination of Life Test Mode of Capsule

2018 ◽  
Vol 18 (3) ◽  
pp. 260-270
Author(s):  
Bosik Kang ◽  
Yongbum Lee ◽  
Dongsoo Jung ◽  
Chungsung Lee
Keyword(s):  
Life Test ◽  
Test Mode

Results from Life Test in Progress on Eagle-Picher Nickel Cadmium Cells

1987 ◽  
Author(s):  
C. C. Badcock ◽  
S. W. Donley ◽  
W. C. Hwang ◽  
J. J. Matsumoto ◽  
T, M. Poston ◽  
...  
Keyword(s):  
Life Test ◽  
Nickel Cadmium

Dendritic Growth Failure of a Mesa Diode

1997 ◽  
Author(s):  
P. Singh ◽  
V. Cozzolino ◽  
G. Galyon ◽  
R. Logan ◽  
K. Troccia ◽  
...  
Keyword(s):  
Electric Fields ◽  
Dendritic Growth ◽  
Silicon Oxide ◽  
Impact Ionization ◽  
Electron Tunneling ◽  
Growth Failure ◽  
Side Wall ◽  
Oxide Interface ◽  
Band Bending ◽  
Cross Section Area

Abstract The time delayed failure of a mesa diode is explained on the basis of dendritic growth on the oxide passivated diode side walls. Lead dendrites nucleated at the p+ side Pb-Sn solder metallization and grew towards the n side metallization. The infinitesimal cross section area of the dendrites was not sufficient to allow them to directly affect the electrical behavior of the high voltage power diodes. However, the electric fields associated with the dendrites caused sharp band bending near the silicon-oxide interface leading to electron tunneling across the band gap at velocities high enough to cause impact ionization and ultimately the avalanche breakdown of the diode. Damage was confined to a narrow path on the diode side wall because of the limited influence of the electric field associated with the dendrite. The paper presents experimental details that led to the discovery of the dendrites. The observed failures are explained in the context of classical semiconductor physics and electrochemistry.

RADC Cathode Life Test Facility

1991 ◽  
Author(s):  
Mark E. Novak ◽  
Dirk T. Bussey ◽  
Edward J. Daniszewski
Keyword(s):  
Test Facility ◽  
Life Test
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