The research of 28nm NMOS TEM sample junction stain analysis
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1999 ◽
Vol 72
(1)
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pp. 124-128
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2013 ◽
Vol 4
(1)
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pp. e216-e217
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1977 ◽
Vol 35
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pp. 468-469
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2010 ◽
Vol 146-147
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pp. 198-201
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