Correlation of very fast transmission line pulse (VFTLP) and Field-Induced Charged Device Model (CDM) Testing

2012 ◽  
Author(s):  
Yang Xue
Keyword(s):  
Transmission Line ◽  
Device Model ◽  
Charged Device Model ◽  
Charged Device ◽  
Fast Transmission

On-Chip Charged Device Model ESD Protection Design Method Using Very Fast Transmission Line Pulse System for RF ICs

2010 ◽  
Vol E93-C (5) ◽  
pp. 625-630 ◽  
Author(s):  
Jae-Young PARK ◽  
Jong-Kyu SONG ◽  
Dae-Woo KIM ◽  
Chang-Soo JANG ◽  
Won-Young JUNG ◽  
...  
Keyword(s):  
Transmission Line ◽  
Design Method ◽  
Pulse System ◽  
Device Model ◽  
Charged Device Model ◽  
Esd Protection ◽  
On Chip ◽  
Charged Device ◽  
Fast Transmission ◽  
Rf Ics

Effect of deshunting sequences of magnetic head using charged device model

2004 ◽  
Vol 272-276 ◽  
pp. 2307-2309 ◽  
Author(s):  
A. Siritaratiwat ◽  
N. Jutong ◽  
C. Pupaichitkul
Keyword(s):  
Magnetic Head ◽  
Device Model ◽  
Charged Device Model ◽  
Charged Device

Gate-controlled field-effect diodes and silicon-controlled rectifier for charged-device model ESD protection in advanced SOI technology

2011 ◽  
Vol 51 (4) ◽  
pp. 756-764 ◽  
Author(s):  
Shuqing Cao ◽  
Jung-Hoon Chun ◽  
Akram A. Salman ◽  
Stephen G. Beebe ◽  
Robert W. Dutton
Keyword(s):  
Field Effect ◽  
Device Model ◽  
Charged Device Model ◽  
Esd Protection ◽  
Charged Device ◽  
Soi Technology
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