The effect of SiO2/SiNx bilayer structure on the bias and light-induced instability in InGaZnO TFTs
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2013 ◽
Vol 105
(11)
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pp. 2495-2506
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2007 ◽
Vol 43
(1)
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pp. 88-97
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2002 ◽
Vol 82
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pp. 265-271
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2016 ◽
Vol 104
(9)
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pp. 2166-2177
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