Non-ideal characteristic analysis of GaN-based light-emitting diode using current-voltage (I–V) and low-frequency noise experiment
2011 ◽
Vol 119
(4)
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pp. 514-520
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2010 ◽
Vol 54
(8)
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pp. 781-786
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2015 ◽
Vol 55
(1)
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pp. 52-61
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1997 ◽
Vol 41
(6)
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pp. 857-864
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