Interfacial characterization of ultra low-k film (kappa=2.55) with time of flight secondary ion mass spectrometry (TOF-SIMS)

2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.2008.4588208 ◽

2008 ◽

Cited By ~ 1

Author(s):

J. Widodo ◽

Z. X. Xing ◽

Z. Q. Mo ◽

T. Ouyang ◽

D. Gui ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Low K ◽

Secondary Ion

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Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of Microbatteries

ACS Applied Materials & Interfaces ◽

10.1021/acsami.1c10352 ◽

2021 ◽

Vol 13 (34) ◽

pp. 41262-41274

Author(s):

Agnieszka Priebe ◽

Jordi Sastre ◽

Moritz H. Futscher ◽

Jakub Jurczyk ◽

Marcos V. Puydinger dos Santos ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Elemental Characterization

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Characterization of sequentially grafted polysaccharide coatings using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and principal component analysis (PCA)

Surface and Interface Analysis ◽

10.1002/sia.1446 ◽

2002 ◽

Vol 33 (12) ◽

pp. 924-931 ◽

Cited By ~ 13

Author(s):

Sally L. McArthur ◽

Matthew S. Wagner ◽

Patrick G. Hartley ◽

Keith M. McLean ◽

Hans J. Griesser ◽

...

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Characterization of gunpowder samples using time-of-flight secondary ion mass spectrometry (TOF-SIMS)

Forensic Science International ◽

10.1016/j.forsciint.2005.02.036 ◽

2006 ◽

Vol 158 (1) ◽

pp. 39-51 ◽

Cited By ~ 48

Author(s):

Christine M. Mahoney ◽

Greg Gillen ◽

Albert J. Fahey

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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THE APPLICATION OF TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (ToF-SIMS) TO THE CHARACTERIZATION OF OPAQUE ANCIENT GLASSES

Archaeometry ◽

10.1111/j.1475-4754.2009.00445.x ◽

2009 ◽

Author(s):

F. J. M. RUTTEN ◽

D. BRIGGS ◽

J. HENDERSON ◽

M. J. ROE

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Time-of-flight secondary ion mass spectrometry (TOF-SIMS) for high-throughput characterization of biosurfaces

Applied Surface Science ◽

10.1016/s0169-4332(02)00822-x ◽

2003 ◽

Vol 203-204 ◽

pp. 855-858 ◽

Cited By ~ 12

Author(s):

S. Roberson ◽

A. Sehgal ◽

A. Fahey ◽

A. Karim

Keyword(s):

Mass Spectrometry ◽

High Throughput ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Characterization of purified biomarker compounds using time of flight-secondary ion mass spectrometry (ToF-SIMS)

Organic Geochemistry ◽

10.1016/j.orggeochem.2004.03.006 ◽

2004 ◽

Vol 35 (7) ◽

pp. 793-811 ◽

Cited By ~ 20

Author(s):

Jan Toporski ◽

Andrew Steele

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Characterization of adhesive and coating constituents by time-of-flight secondary ion mass spectrometry (ToF-SIMS). Part 1: Epoxy-terminated diglycidyl polyethers of bisphenol-A and propal-2-ol

Surface and Interface Analysis ◽

10.1002/sia.740200519 ◽

1993 ◽

Vol 20 (5) ◽

pp. 449-456 ◽

Cited By ~ 20

Author(s):

J. A. Treverton ◽

A. J. Paul ◽

J. C. Vickerman

Keyword(s):

Mass Spectrometry ◽

Bisphenol A ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Characterization of hydrogenated graphite powder by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

RSC Advances ◽

10.1039/c6ra17954a ◽

2016 ◽

Vol 6 (84) ◽

pp. 80649-80654 ◽

Cited By ~ 5

Author(s):

Wenjing Xie ◽

Kai Mo Ng ◽

Lu-Tao Weng ◽

Chi-Ming Chan

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Graphite Powder ◽

X Ray ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

Hydrogenated graphite powder was obtained through Birch reduction of graphite powder and characterized by X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) at 500 °C.

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THE APPLICATION OF TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (ToF-SIMS) TO THE CHARACTERIZATION OF OPAQUE ANCIENT GLASSES*

Archaeometry ◽

10.1111/j.1475-4754.2008.00445.x ◽

2009 ◽

Vol 51 (6) ◽

pp. 966-986 ◽

Cited By ~ 12

Author(s):

F. J. M. RUTTEN ◽

D. BRIGGS ◽

J. HENDERSON ◽

M. J. ROE

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Characterization of hydroxyapatite deposition on biomimetic polyphosphazenes by time-of-flight secondary ion mass spectrometry (ToF-SIMS)

RSC Advances ◽

10.1039/c3ra47205a ◽

2014 ◽

Vol 4 (38) ◽

pp. 19680-19689 ◽

Cited By ~ 2

Author(s):

Nicole L. Morozowich ◽

Jordan O. Lerach ◽

Tomasz Modzelewski ◽

Lauren Jackson ◽

Nicholas Winograd ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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