Correlation between transmission-line-pulsing I-V curve and human-body-model ESD level on low temperature poly-Si TFT devices

Author(s):  
Ming-Dou Ker ◽  
Chun-Lin Hou ◽  
Chih-Yih Chang ◽  
Fang-Tsun Chu
1998 ◽  
Vol 38 (11) ◽  
pp. 1773-1780 ◽  
Author(s):  
W Stadler ◽  
X Guggenmos ◽  
P Egger ◽  
H Gieser ◽  
C Musshoff

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