Reliability oriented process and device simulations of power VDMOS transistors in Bipolar/CMOS/DMOS technology

IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.2003.1222733 ◽

2004 ◽

Cited By ~ 4

Author(s):

Y. Rey-Tauriac ◽

M. Taurin ◽

H. Lhermite ◽

O. Bonnaud

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