Merging territories part II - A new information design baccalaureate degree moves forward

Author(s):  
Glenn Ruhl ◽  
Brian Traynor
Author(s):  
Joe G. Baker ◽  
Michael G. Finn

This paper examines why enrollment of foreign national students in U.S. economics graduate programs increased so dramatically since the 1960s.   New information regarding the “stay rates” of foreign national students is examined.  The paper concludes that growth in the number of  foreign national economics graduate students was related to the quality of U.S. graduate programs, growth in foreign social science baccalaureate degree awards, growing foreign incomes, and movement of foreign economies towards markets.  These trends were especially pronounced in Asia, where most foreign national economics students are from.


2003 ◽  
Vol 11 (1) ◽  
pp. 82-90 ◽  
Author(s):  
Dino Karabeg

By designing information design we arrive at a completely new approach to information. Within this new approach we are able to create new information formats, find new uses for the new media, give information new purposes, create new kinds of information and develop new methods for creating information. The Polyscopic Modeling methodology is proposed as a prototype of a designed informing.


Author(s):  
Ramesh Srinivasan

This chapter points to the potential new information architectures hold in the design of virtual science centers. Science centers are treated as education-focused institutions and the argument is made that that extending the power of the science center as an educational platform warrants an answer to the question of how to share knowledge across the community of visitors without physical co-assembly. Two approaches toward information design are discussed: community-driven ontologies and social information filtering agents. These approaches are introduced within the context of two pieces of previous research and hold great potential when applied to the Web environment of the science center.


Author(s):  
Norbert J. Delatte ◽  
Mark Milke

Recovery of the city of New Orleans from Hurricane Katrina in 2005 and recovery of Christchurch, New Zealand from the earthquakes of 2011 are used as case studies for examining the changing nature of engineering design. While in both cases the loss of life was considerable, each event was followed by several years of severe economic disruption. The examination highlights that the high indirect costs of civil engineering failure along with the unpredictable nature of extreme events increasingly require adaptive solutions. Design could change from a process that happens once over a 50-year lifespan to a process where re-design is considered every 10 years, each time evaluating new information. Design as an adaptive process will require revisiting issues such as design contracts, the separation of design from construction and operation, and education of engineering design.


Author(s):  
J. Y. Koo ◽  
G. Thomas

High resolution electron microscopy has been shown to give new information on defects(1) and phase transformations in solids (2,3). In a continuing program of lattice fringe imaging of alloys, we have applied this technique to the martensitic transformation in steels in order to characterize the atomic environments near twin, lath and αmartensite boundaries. This paper describes current progress in this program.Figures A and B show lattice image and conventional bright field image of the same area of a duplex Fe/2Si/0.1C steel described elsewhere(4). The microstructure consists of internally twinned martensite (M) embedded in a ferrite matrix (F). Use of the 2-beam tilted illumination technique incorporating a twin reflection produced {110} fringes across the microtwins.


Author(s):  
L. Andrew Staehelin

Freeze-etched membranes usually appear as relatively smooth surfaces covered with numerous small particles and a few small holes (Fig. 1). In 1966 Branton (1“) suggested that these surfaces represent split inner mem¬brane faces and not true external membrane surfaces. His theory has now gained wide acceptance partly due to new information obtained from double replicas of freeze-cleaved specimens (2,3) and from freeze-etch experi¬ments with surface labeled membranes (4). While theses studies have fur¬ther substantiated the basic idea of membrane splitting and have shown clearly which membrane faces are complementary to each other, they have left the question open, why the replicated membrane faces usually exhibit con¬siderably fewer holes than particles. According to Branton's theory the number of holes should on the average equal the number of particles. The absence of these holes can be explained in either of two ways: a) it is possible that no holes are formed during the cleaving process e.g. due to plastic deformation (5); b) holes may arise during the cleaving process but remain undetected because of inadequate replication and microscope techniques.


Author(s):  
Y. Taniguchi ◽  
E. Nakazawa ◽  
S. Taya

Imaging energy filters can add new information to electron microscopic images with respect to energy-axis, so-called electron spectroscopic imaging (ESI). Recently, many good results have been reported using this imaging technique. ESI also allows high-contrast observation of unstained biological samples, becoming a trend of the field of morphology. We manufactured a new type of energy filter as a trial production. This energy filter consists of two magnets, and we call γ-filter since the trajectory of electrons shows ‘γ’-shape inside the filter. We evaluated the new energyγ-filter TEM with the γ-filter.Figure 1 shows schematic view of the electron optics of the γ-type energy filter. For the determination of the electron-optics of the γ-type energy filter, we used the TRIO (Third Order Ion Optics) program which has been developed for the design of high resolution mass spectrometers. The TRIO takes the extended fringing fields (EFF) into consideration. EFF makes it difficult to design magnetic energy filters with magnetic sector fields.


Author(s):  
Klaus-Ruediger Peters

Only recently it became possible to expand scanning electron microscopy to low vacuum and atmospheric pressure through the introduction of several new technologies. In principle, only the specimen is provided with a controlled gaseous environment while the optical microscope column is kept at high vacuum. In the specimen chamber, the gas can generate new interactions with i) the probe electrons, ii) the specimen surface, and iii) the specimen-specific signal electrons. The results of these interactions yield new information about specimen surfaces not accessible to conventional high vacuum SEM. Several microscope types are available differing from each other by the maximum available gas pressure and the types of signals which can be used for investigation of specimen properties.Electrical non-conductors can be easily imaged despite charge accumulations at and beneath their surface. At high gas pressures between 10-2 and 2 torr, gas molecules are ionized in the electrical field between the specimen surface and the surrounding microscope parts through signal electrons and, to a certain extent, probe electrons. The gas provides a stable ion flux for a surface charge equalization if sufficient gas ions are provided.


Author(s):  
U. Gross ◽  
P. Hagemann

By addition of analytical equipment, scanning transmission accessories and data processing equipment the basic transmission electron microscope (TEM) has evolved into a comprehensive information gathering system. This extension has led to increased complexity of the instrument as compared with the straightforward imaging microscope, since in general new information capacity has required the addition of new control hardware. The increased operational complexity is reflected in a proliferation of knobs and buttons.In the conventional electron microscope design the operating panel of the instrument has distinct control elements to alter optical conditions of the microscope column in different modes. As a consequence a multiplicity of control functions has been inevitable. Examples of this are the three pairs of focus and magnification controls needed for TEM imaging, diffraction patterns, and STEM images.


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