A Configurable Modular Test Processor and Scan Controller Architecture

13th IEEE International On-Line Testing Symposium (IOLTS 2007) ◽

10.1109/iolts.2007.6 ◽

2007 ◽

Author(s):

R. Frost Brandenburg ◽

D. Rudolph ◽

C. Galke ◽

R. Kothe ◽

H.T. Vierhaus

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