Analysis of multilayer microstrip line of finite conductor thickness using Quasi-Static Spectral Domain Analysis (SDA) and Single Layer Reduction (SLR) method
1989 ◽
Vol 37
(6)
◽
pp. 947-952
◽
1996 ◽
Vol 44
(7)
◽
pp. 1174-1178
◽
1993 ◽
Vol 14
(8)
◽
pp. 1531-1545
◽
1982 ◽
Vol 30
(5)
◽
pp. 825-828
◽
2019 ◽
Vol 9
(6)
◽
pp. 540-548
Keyword(s):