Contrast sensitivity and dynamic range measurements of CdZnTe semiconductors for direct type flat-panel imaging

2002 ◽  
Author(s):  
G.C. Giakos ◽  
R. Guntupalli ◽  
N. Shah ◽  
S. Vedantham ◽  
S. Suryanarayanan ◽  
...  
Keyword(s):  
Contrast Sensitivity ◽  
Dynamic Range ◽  
Flat Panel ◽  
Range Measurements ◽  
Flat Panel Imaging

Detected contrast and dynamic range measurements of CdZnTe semiconductors for flat-panel digital radiography

2001 ◽  
Vol 50 (6) ◽  
pp. 1604-1609 ◽  
Author(s):  
G.C. Giakos ◽  
R. Guntupalli ◽  
N. Shah ◽  
S. Vedantham ◽  
S. Suryanarayanan ◽  
...  
Keyword(s):  
Digital Radiography ◽  
Dynamic Range ◽  
Flat Panel ◽  
Range Measurements

Investigation of time-resolved proton radiography using x-ray flat-panel imaging system

2017 ◽  
Vol 62 (5) ◽  
pp. 1905-1919 ◽  
Author(s):  
K-W Jee ◽  
R Zhang ◽  
E H Bentefour ◽  
P J Doolan ◽  
E Cascio ◽  
...  
Keyword(s):  
Imaging System ◽  
Flat Panel ◽  
Proton Radiography ◽  
Time Resolved ◽  
X Ray ◽  
Flat Panel Imaging

scholarly journals Analysis and Design of a Hybrid Optical Fiber Refractometer for Large Dynamic Range Measurements

2020 ◽  
Vol 20 (10) ◽  
pp. 5260-5269
Author(s):  
Haris Apriyanto ◽  
Olivier D. Bernal ◽  
Michel Cattoen ◽  
Francoise Lizion ◽  
James H. Sharp ◽  
...  
Keyword(s):  
Optical Fiber ◽  
Dynamic Range ◽  
Large Dynamic Range ◽  
Range Measurements ◽  
Analysis And Design

Improved spatial resolution in flat-panel imaging systems

1998 ◽  
Author(s):  
John Yorkston ◽  
Larry E. Antonuk ◽  
Youcef El-Mohri ◽  
Kyung-Wook Jee ◽  
Weidong Huang ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Imaging Systems ◽  
Flat Panel ◽  
Flat Panel Imaging

4 Amorphous silicon flat panel imaging devices for pretreatment verification and in vivo dosimetry of IMRT

2005 ◽  
Vol 76 ◽  
pp. S15
Author(s):  
M. Wendling ◽  
L.N. McDermott ◽  
B. van Asselen ◽  
J.-J. Sonke ◽  
J. Stroom ◽  
...  
Keyword(s):  
Amorphous Silicon ◽  
In Vivo Dosimetry ◽  
Flat Panel ◽  
Flat Panel Imaging
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