Arbitrary Waveform Generator Response Shaping Method to Enable ADC Linearity Testing on Very Low Cost Automatic Test Equipment

2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop ◽

10.1109/ims3tw.2011.18 ◽

2011 ◽

Author(s):

Sachin Dileep Dasnurkar ◽

Jacob A. Abraham

Keyword(s):

Low Cost ◽

Test Equipment ◽

Automatic Test Equipment ◽

Waveform Generator ◽

Arbitrary Waveform Generator ◽

Automatic Test ◽

Arbitrary Waveform ◽

Linearity Testing

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Performance Evaluation of Non Volatile Memories with a Low Cost and Portable Automatic Test Equipment

Lecture Notes in Electrical Engineering - Applications in Electronics Pervading Industry, Environment and Society ◽

10.1007/978-3-319-55071-8_19 ◽

2017 ◽

pp. 147-152

Author(s):

Gineuve Alieri ◽

G. Costantino Giaconia ◽

Leonardo Mistretta ◽

Francesco La Rosa ◽

A. Angelo Cimino

Keyword(s):

Performance Evaluation ◽

Low Cost ◽

Test Equipment ◽

Automatic Test Equipment ◽

Automatic Test

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A Low-Cost Arbitrary Waveform Generator Using Arduino-Simulink Platform

10.1109/icvee54186.2021.9649722 ◽

2021 ◽

Author(s):

Arif Widodo ◽

Zain Bahaul Anwar

Keyword(s):

Low Cost ◽

Waveform Generator ◽

Arbitrary Waveform Generator ◽

Arbitrary Waveform

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Low-cost high-voltage arbitrary waveform generator for broad lifetime measurements of electroluminescent devices

2016 IEEE 2nd Annual Southern Power Electronics Conference (SPEC) ◽

10.1109/spec.2016.7846014 ◽

2016 ◽

Cited By ~ 1

Author(s):

Katrin Hirmer ◽

Peter Schuster ◽

Ferdinand Keil ◽

Klaus Hofmann

Keyword(s):

High Voltage ◽

Low Cost ◽

Waveform Generator ◽

Arbitrary Waveform Generator ◽

Lifetime Measurements ◽

Electroluminescent Devices ◽

Arbitrary Waveform

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FPGA Based Low Cost Automatic Test Equipment for Digital Circuits

Istanbul University - Journal of Electrical & Electronics Engineering ◽

10.26650/electrica.2018.28093 ◽

2019 ◽

Vol 19 (1) ◽

pp. 12-21

Author(s):

Alp Arslan Bayrakci ◽

Keyword(s):

Digital Circuits ◽

Low Cost ◽

Test Equipment ◽

Automatic Test Equipment ◽

Automatic Test

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Factors influencing the acquisition of low cost deployable automatic test equipment-LCDATE

Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century' ◽

10.1109/autest.1995.522677 ◽

2002 ◽

Author(s):

D. Joel

Keyword(s):

Low Cost ◽

Test Equipment ◽

Automatic Test Equipment ◽

Automatic Test ◽

Factors Influencing

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Hybrid BiST solution for Analog to Digital Converters with low-cost Automatic Test Equipment compatibility

2009 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.2009.5117672 ◽

2009 ◽

Cited By ~ 4

Author(s):

Sachin Dasnurkar ◽

Jacob A. Abraham

Keyword(s):

Low Cost ◽

Analog To Digital Converters ◽

Test Equipment ◽

Automatic Test Equipment ◽

Automatic Test ◽

Analog To Digital

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Low-Cost Automatic Test Equipment for Digital ICs Using DE0-Nano - Altera Cyclone IV FPGA

10.1109/icecie52348.2021.9664695 ◽

2021 ◽

Author(s):

Lahiru Nawarathna ◽

Nalith Udugampola ◽

Yasara Yasawardhana ◽

Thilina Weerasinghe ◽

Subramaniam Thayaparan

Keyword(s):

Low Cost ◽

Test Equipment ◽

Automatic Test Equipment ◽

Automatic Test

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FPGA-based low-cost automatic test equipment for digital integrated circuits

2009 IEEE International Workshop on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications ◽

10.1109/idaacs.2009.5343031 ◽

2009 ◽

Cited By ~ 11

Author(s):

Luca Mostardini ◽

Luca Bacciarelli ◽

Luca Fanucci ◽

Lorenzo Bertini ◽

Marco Tonare ◽

...

Keyword(s):

Integrated Circuits ◽

Low Cost ◽

Test Equipment ◽

Automatic Test Equipment ◽

Digital Integrated Circuits ◽

Automatic Test

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20V-high speed low cost arbitrary waveform generator for ICs immunity test

2011 IEEE International Symposium on Electromagnetic Compatibility ◽

10.1109/isemc.2011.6038426 ◽

2011 ◽

Author(s):

Xu Gao ◽

Tianqi Li ◽

Nicholas Bennett Mentesana ◽

Zhenwei Yu ◽

Aleksandr Yakubovich Gafarov ◽

...

Keyword(s):

High Speed ◽

Low Cost ◽

Waveform Generator ◽

Arbitrary Waveform Generator ◽

Arbitrary Waveform

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Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE)

2014 International SoC Design Conference (ISOCC) ◽

10.1109/isocc.2014.7087606 ◽

2014 ◽

Author(s):

Keewon Cho ◽

Woosung Lee ◽

Jooyoung Kim ◽

Sungho Kang

Keyword(s):

Low Cost ◽

Partial Solution ◽

Search Tree ◽

Test Equipment ◽

Automatic Test Equipment ◽

Automatic Test

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