Rigid Regression for Facial Image Interpolation with Local Structure Prior

2014 ◽  
Author(s):  
Ru Xing ◽  
Jican Fu ◽  
Yan Shao ◽  
Junling You
Keyword(s):  
Local Structure ◽  
Image Interpolation ◽  
Facial Image

AN IMPROVED EDGE-DIRECTED IMAGE INTERPOLATION ALGORITHM

2012 ◽  
Vol 12 (04) ◽  
pp. 1250023 ◽  
Author(s):  
XINGYUAN WANG ◽  
ZHIFENG CHEN ◽  
XUEMEI BAO
Keyword(s):  
Real Time ◽  
Local Structure ◽  
Time Complexity ◽  
Image Interpolation ◽  
Threshold Value ◽  
Subjective Quality ◽  
Experimental Results ◽  
Interpolation Algorithm ◽  
Visual Effects ◽  
Structure Characteristics

The paper sets forth an improved edge-directed image interpolation algorithm with low time complexity. The algorithm partitions images into homogeneous and edge areas by setting the preset threshold value based on the local structure characteristics. Specified algorithms are assigned to interpolate each classified areas respectively. The proposed method implements strategy in three steps to interpolate after setting the preset threshold value. In this way, it can achieve the goals of real-time interpolation and good subjective quality. Furthermore, the interpolated images have much more explicit edge regions and better visual effects using our proposed method than that of using other algorithms. Experimental results demonstrate that the method proposed by the authors is high-performed in image interpolation.

X-ray microprobe for materials science

1994 ◽  
Vol 52 ◽  
pp. 56-57
Author(s):  
G.E. Ice
Keyword(s):  
Crystallographic Orientation ◽  
Local Structure ◽  
Materials Science ◽  
Chemical Information ◽  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Novel Materials ◽  
New Information ◽  
Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

DETERMINATION OF THE LOCAL STRUCTURE OF METALLIC GLASSES BY EXAFS

1982 ◽  
Vol 43 (C9) ◽  
pp. C9-43-C9-46 ◽  
Author(s):  
A. Sadoc ◽  
A. M. Flank ◽  
D. Raoux ◽  
P. Lagarde
Keyword(s):  
Metallic Glasses ◽  
Local Structure

LOCAL STRUCTURE IN InGaAsP QUATERNARY ALLOYS

1986 ◽  
Vol 47 (C8) ◽  
pp. C8-423-C8-426
Author(s):  
H. OYANAGI ◽  
Y. TAKEDA ◽  
T. MATSUSHITA ◽  
T. ISHIGURO ◽  
A. SASAKI
Keyword(s):  
Local Structure ◽  
Quaternary Alloys

LOCAL STRUCTURE AND THERMODYNAMICS OF II-VI AND III-V SEMICONDUCTORS BY EXAFS

1986 ◽  
Vol 47 (C8) ◽  
pp. C8-403-C8-406
Author(s):  
N. MOTTA ◽  
A. BALZAROTTI ◽  
P. LETARDI
Keyword(s):  
Local Structure

Facial Image Super-Resolution Reconstruction Based on Separated Frequency Components

2013 ◽  
Vol E96.A (6) ◽  
pp. 1315-1322 ◽  
Author(s):  
Hyunduk KIM ◽  
Sang-Heon LEE ◽  
Myoung-Kyu SOHN ◽  
Dong-Ju KIM ◽  
Byungmin KIM
Keyword(s):  
Super Resolution ◽  
Facial Image ◽  
Frequency Components ◽  
Image Super Resolution
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