Dual-channel technology with cap-free single metal gate for high performance CMOS in gate-first and gate-last integration

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L. Witters ◽  
J. Mitard ◽  
A. Veloso ◽  
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2019 ◽  
Vol 1 (5) ◽  
pp. 609-623 ◽  
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G. L. Zhang ◽  
S. H. Bae ◽  
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Y.H. Kim ◽  
B.P. Linder ◽  
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2016 ◽  
Vol 4 (5) ◽  
pp. 246-252 ◽  
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