An FPGA Implementation of a High Resolution Phase Shift Beamformer

2007 ◽  
Author(s):  
Antoine B. Abche ◽  
Aldo Maalouf ◽  
Rafic Ayoubi ◽  
Elie Karam ◽  
A. M. Alameddine
Keyword(s):  
High Resolution ◽  
Phase Shift ◽  
Fpga Implementation

scholarly journals Accretion Disk Structure in SS Cygni

1987 ◽  
Vol 93 ◽  
pp. 351-364
Author(s):  
F.V. Hessman
Keyword(s):  
High Resolution ◽  
Phase Shift ◽  
Accretion Disk ◽  
Phase Stability ◽  
Large Scale ◽  
Large Fraction ◽  
Line Emission ◽  
Simple Explanation ◽  
Disk Structure ◽  
Magnetic Origin

AbstractHigh-resolution Coude observations of non-axisymmetric line emission -from the dwarf nova SS Cygni are presented. By subtracting the constant line component, the asymmetric line emission responsible for the observed phase shift between the absorption and emission line radial velocity curves can be isolated. The extra emission is a large fraction of the total line emission and extends to large velocities (~1500 km sec−1). The phase stability of the emission demands a large-scale structure which is fixed in the frame of the binary. A magnetic origin of the excitation cannot De ruled out but is implausible. A simple explanation is that the accretion stream from the companion star is able to spill over the sags of the disk, introducing emission at non-circular velocities and most likely disturbing the upper layers of the accretion disk.

Development of High Speed High Resolution Camera for Fuel Injection Process by Using Phase Shift Photographing

2019 ◽  
Vol 2019.25 (0) ◽  
pp. 18B09
Author(s):  
FENG Yuanrun ◽  
Hideaki TAKAHASHI ◽  
Kazuyuki KOJIMA ◽  
Hiroyuki SATO
Keyword(s):  
High Resolution ◽  
Phase Shift ◽  
High Speed ◽  
Fuel Injection ◽  
Injection Process

High-resolution Neutron Diffraction using Larmor Precession

1998 ◽  
Vol 31 (5) ◽  
pp. 742-747
Author(s):  
W. H. Kraan ◽  
C. T. Kaiser ◽  
M. Th. Rekveldt
Keyword(s):  
High Resolution ◽  
Phase Shift ◽  
Neutron Beam ◽  
Fourier Transformation ◽  
Small Range ◽  
Diffraction Experiment ◽  
Reference Region ◽  
Larmor Precession ◽  
Set Up ◽  
Optical Pathway

A polarized neutron beam travels through a precession coil with fieldBand the intensity in a detector behind the analyser is recorded as a function ofB. Fourier transformation of the intensity signal gives the wavelength spectrum of the beam entering the detector. Any (diffraction) experiment can be set up in the optical pathway between the analyser and detector. This technique is applied in an array of high-resolution diffraction experiments along the path of the neutron beam through a bent Al strip. The detector intensities are measured only over a small range ofBaway from B=0. The phase shift between the intensity signals from compressed/extended regions, relative to the signal from a reference region in the strip, reveals the deformation of the Al lattice.

A preliminary report of development of high resolution phase shift interferometry for the assessment of nuclear waster disposal

2006 ◽  
Vol 88 (1-3) ◽  
pp. 355-357 ◽  
Author(s):  
A. Ueda ◽  
S. Ueta ◽  
K. Kato ◽  
K. Tsukamoto ◽  
H. Sato ◽  
...  
Keyword(s):  
High Resolution ◽  
Phase Shift ◽  
Preliminary Report

Instantaneous high-resolution focus tracking and a vibrometery system using parallel phase shift interferometry

2016 ◽  
Vol 18 (9) ◽  
pp. 09LT02 ◽  
Author(s):  
Michael Ney ◽  
Avner Safrani ◽  
Ibrahim Abdulhlaim
Keyword(s):  
High Resolution ◽  
Phase Shift

Fourier spectrum analysis of phase contrast of support film

1978 ◽  
Vol 36 (1) ◽  
pp. 170-171
Author(s):  
Tetsuo Oikawa ◽  
Fumiko Ishigaki ◽  
Kiichi Hojou ◽  
Koichi Kanaya
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Phase Shift ◽  
Phase Contrast ◽  
Fourier Transforms ◽  
Spherical Aberration ◽  
High Resolution Electron Microscopy ◽  
Spatial Frequencies ◽  
Resolution Electron ◽  
Atomic Phase

In high resolution electron microscopy, it is most important to determine the defocus of electron micrographs of amorphous support films. The variation of spatial frequencies of phase contrast of support films was obtained from the phase shift of the electron waves caused by defocus and spherical aberration as well as the atomic phase, which are demonstrated by use of optical Fourier transforms. The spatial frequencies of phase contrast of films of tungsten, prepared by ion bombardment, which are useful as support films for high resolution electron microscopy, has been discussed analytically.Taking account of atomic phase shift, the transfer function, which was originally presented by Thon (1966), was modified. Optical Fourier transforms are in similar to the calculated Fourier transforms of corre- sponding computed images. Accordingly, it turned out that the atomic phase shift should not be neglected. The thickness of tungsten film, in case of less than 2 nm thickness, can be determined by comparing the optical Fourier transforms with the calculated ones.

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