Defect passivation and interface engineering for high-K gate dielectric device performance and reliability enhancement

Author(s):  
Hsing-huang Tseng
2002 ◽  
Vol 303 (1) ◽  
pp. 54-63 ◽  
Author(s):  
P.S. Lysaght ◽  
P.J. Chen ◽  
R. Bergmann ◽  
T. Messina ◽  
R.W. Murto ◽  
...  

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