Improvement of silicon dioxide integrity against hole-related breakdown with the incorporation of foreign atoms: molecular orbital examination
1985 ◽
Vol 46
(7)
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pp. 841-857
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1982 ◽
Vol 43
(C4)
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pp. C4-103-C4-108
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2020 ◽
Vol 140
(11)
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pp. 529-533
High Temperature Material Processes An International Quarterly of High-Technology Plasma Processes
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2019 ◽
Vol 23
(3)
◽
pp. 283-290
Keyword(s):
2003 ◽
Vol 32
(5)
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pp. 211-218
2019 ◽
Keyword(s):