Multipath Interference Compensation in Time-of-Flight Camera Images

2010 ◽  
Author(s):  
Stefan Fuchs
Keyword(s):  
Time Of Flight ◽  
Multipath Interference ◽  
Interference Compensation

scholarly journals Resolving multipath interference in time-of-flight imaging via modulation frequency diversity and sparse regularization

2014 ◽  
Vol 39 (6) ◽  
pp. 1705 ◽  
Author(s):  
Ayush Bhandari ◽  
Achuta Kadambi ◽  
Refael Whyte ◽  
Christopher Barsi ◽  
Micha Feigin ◽  
...  
Keyword(s):  
Modulation Frequency ◽  
Time Of Flight ◽  
Frequency Diversity ◽  
Sparse Regularization ◽  
Multipath Interference ◽  
Time Of Flight Imaging

Modeling and correction of multipath interference in time of flight cameras

2014 ◽  
Vol 32 (1) ◽  
pp. 1-13 ◽  
Author(s):  
David Jiménez ◽  
Daniel Pizarro ◽  
Manuel Mazo ◽  
Sira Palazuelos
Keyword(s):  
Time Of Flight ◽  
Multipath Interference

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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