Advanced control methodologies with industrial applications

Energies ◽  
2020 ◽  
Vol 13 (24) ◽  
pp. 6594
Author(s):  
Ahmed Aboelhassan ◽  
M. Abdelgeliel ◽  
Ezz Eldin Zakzouk ◽  
Michael Galea

Advanced control approaches are essential for industrial processes to enhance system performance and increase the production rate. Model Predictive Control (MPC) is considered as one of the promising advanced control algorithms. It is suitable for several industrial applications for its ability to handle system constraints. However, it is not widely implemented in the industrial field as most field engineers are not familiar with the advanced techniques conceptual structure, the relation between the parameter settings and control system actions. Conversely, the Proportional Integral Derivative (PID) controller is a common industrial controller known for its simplicity and robustness. Adapting the parameters of the PID considering system constraints is a challenging task. Both controllers, MPC and PID, merged in a hierarchical structure in this work to improve the industrial processes performance considering the operational constraints. The proposed control system is simulated and implemented on a three-tank benchmark system as a Multi-Input Multi-Output (MIMO) system. Since the main industrial goal of the proposed configuration is to be easily implemented using the available automation technology, PID controller is implemented in a PLC (Programable Logic Controller) controller as a lower controller level, while MPC controller and the adaptation mechanism are implemented within a SCADA (Supervisory Control And Data Acquisition) system as a higher controller level.


Sensors ◽  
2020 ◽  
Vol 21 (1) ◽  
pp. 160
Author(s):  
Peter Minarčík ◽  
Hynek Procházka ◽  
Martin Gulan

Gathering data and monitoring performance are at the heart of energy efficiency and comfort securing strategies in smart buildings. Therefore, it is crucial to present the obtained data to the user or administrator of such a building in an appropriate form. Moreover, evaluating the data in real time not only helps to maintain comfort, but also allows for a timely response from the user or operator to a possible fault. Continuous online monitoring and analysis of process behaviour, which is referred to as advanced supervision, is addressed in this paper by developing a procedure that will form an artificial operator autonomously supervising process. After introducing several techniques that are used for signal analysis, we propose an approach to advanced supervision of processes in smart buildings or other industrial control systems. The developed procedure is implemented on a control system platform that is particularly suitable for this purpose. Moreover, this platform includes a framework that provides support for the implementation of advanced control techniques and it is based on open-source tools, which is rarely seen in industrial applications. The developed advanced supervision procedure has been tested in simulation as well as in a practical case study using a real two-storey family house.


Author(s):  
C. F. Oster

Although ultra-thin sectioning techniques are widely used in the biological sciences, their applications are somewhat less popular but very useful in industrial applications. This presentation will review several specific applications where ultra-thin sectioning techniques have proven invaluable.The preparation of samples for sectioning usually involves embedding in an epoxy resin. Araldite 6005 Resin and Hardener are mixed so that the hardness of the embedding medium matches that of the sample to reduce any distortion of the sample during the sectioning process. No dehydration series are needed to prepare our usual samples for embedding, but some types require hardening and staining steps. The embedded samples are sectioned with either a prototype of a Porter-Blum Microtome or an LKB Ultrotome III. Both instruments are equipped with diamond knives.In the study of photographic film, the distribution of the developed silver particles through the layer is important to the image tone and/or scattering power. Also, the morphology of the developed silver is an important factor, and cross sections will show this structure.


Author(s):  
W.M. Stobbs

I do not have access to the abstracts of the first meeting of EMSA but at this, the 50th Anniversary meeting of the Electron Microscopy Society of America, I have an excuse to consider the historical origins of the approaches we take to the use of electron microscopy for the characterisation of materials. I have myself been actively involved in the use of TEM for the characterisation of heterogeneities for little more than half of that period. My own view is that it was between the 3rd International Meeting at London, and the 1956 Stockholm meeting, the first of the European series , that the foundations of the approaches we now take to the characterisation of a material using the TEM were laid down. (This was 10 years before I took dynamical theory to be etched in stone.) It was at the 1956 meeting that Menter showed lattice resolution images of sodium faujasite and Hirsch, Home and Whelan showed images of dislocations in the XlVth session on “metallography and other industrial applications”. I have always incidentally been delighted by the way the latter authors misinterpreted astonishingly clear thickness fringes in a beaten (”) foil of Al as being contrast due to “large strains”, an error which they corrected with admirable rapidity as the theory developed. At the London meeting the research described covered a broad range of approaches, including many that are only now being rediscovered as worth further effort: however such is the power of “the image” to persuade that the above two papers set trends which influence, perhaps too strongly, the approaches we take now. Menter was clear that the way the planes in his image tended to be curved was associated with the imaging conditions rather than with lattice strains, and yet it now seems to be common practice to assume that the dots in an “atomic resolution image” can faithfully represent the variations in atomic spacing at a localised defect. Even when the more reasonable approach is taken of matching the image details with a computed simulation for an assumed model, the non-uniqueness of the interpreted fit seems to be rather rarely appreciated. Hirsch et al., on the other hand, made a point of using their images to get numerical data on characteristics of the specimen they examined, such as its dislocation density, which would not be expected to be influenced by uncertainties in the contrast. Nonetheless the trends were set with microscope manufacturers producing higher and higher resolution microscopes, while the blind faith of the users in the image produced as being a near directly interpretable representation of reality seems to have increased rather than been generally questioned. But if we want to test structural models we need numbers and it is the analogue to digital conversion of the information in the image which is required.


Author(s):  
C J R Sheppard

The confocal microscope is now widely used in both biomedical and industrial applications for imaging, in three dimensions, objects with appreciable depth. There are now a range of different microscopes on the market, which have adopted a variety of different designs. The aim of this paper is to explore the effects on imaging performance of design parameters including the method of scanning, the type of detector, and the size and shape of the confocal aperture.It is becoming apparent that there is no such thing as an ideal confocal microscope: all systems have limitations and the best compromise depends on what the microscope is used for and how it is used. The most important compromise at present is between image quality and speed of scanning, which is particularly apparent when imaging with very weak signals. If great speed is not of importance, then the fundamental limitation for fluorescence imaging is the detection of sufficient numbers of photons before the fluorochrome bleaches.


Author(s):  
R. T. Chen ◽  
R.A. Norwood

Sol-gel processing has been used to control the structure of a material on a nanometer scale in preparing advanced ceramics and glasses. Film coating using the sol-gel process was also found to be a viable process technology in applications such as optical, porous, antireflection and hard coatings. In this study, organically modified silicate (Ormosil) coatings are applied to PET films for various industrial applications. Sol-gel materials are known to exhibit nanometer scale structures which havepreviously been characterized by small-angle X-ray scattering (SAXS), neutron scattering and light scattering. Imaging of the ultrafine sol-gel structures has also been performed using an ultrahigh resolution replica/TEM technique. The objective of this study was to evaluate the ultrafine structures inthe sol gel coatings using a direct imaging technique: atomic force microscopy (AFM). In addition, correlation of microstructures with processing parameters, coating density and other physical properties will be discussed.The materials evaluated are organically modified silicate coatings on PET film substrates. Refractive index measurement by the prism coupling method was used to assess density of the sol-gel coating.AFM imaging was performed on a Nanoscope III AFM (by Digital Instruments) using constant force mode. Solgel coating samples coated with a thin layer of Ft (by ion beam sputtering) were also examined by STM in order to confirm the structures observed in the contact type AFM. In addition, to compare the previous results, sol-gel powder samples were also prepared by ultrasonication followed by Pt/Au shadowing and examined using a JEOL 100CX TEM.


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