Automated generation of test cases from output domain of an embedded system using Genetic algorithms
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2018 ◽
Vol 7
(2.7)
◽
pp. 146
2011 ◽
Vol 21
(01)
◽
pp. 103-127
◽
2020 ◽
Vol 8
(6)
◽
pp. 4466-4473
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Keyword(s):