A contribution to unravel the mysteries of electrical aging under DC electrical stress: where we are and where we would need to go

2018 ◽  
Author(s):  
Gian Carlo Montanari
Keyword(s):  
Electrical Stress ◽  
Electrical Aging

Colorimetric Characterizations of Large Area White OLEDs Under Thermal And Electrical Stress Using TM-30-18 Method

2020 ◽  
Author(s):  
Oussama Ben Abdellah ◽  
Andrea Al Haddad ◽  
Mustapha El Halaoui ◽  
Pascal Dupuis ◽  
Laurent Canale ◽  
...  
Keyword(s):  
Large Area ◽  
Electrical Stress ◽  
White Oleds

scholarly journals Reliability-Aware SPICE Compatible Compact Modeling of IGZO Inverters on a Flexible Substrate

2021 ◽  
Vol 11 (11) ◽  
pp. 4838
Author(s):  
Je-Hyuk Kim ◽  
Youngjin Seo ◽  
Jun Tae Jang ◽  
Shinyoung Park ◽  
Dongyeon Kang ◽  
...  
Keyword(s):  
Flexible Electronics ◽  
Circuit Simulation ◽  
Flexible Substrate ◽  
Atomic Layer ◽  
Operating Conditions ◽  
Gate Insulator ◽  
Compact Modeling ◽  
Indium Gallium Zinc Oxide ◽  
Electrical Stress ◽  
Bending Radius

Accurate circuit simulation reflecting physical and electrical stress is of importance in indium gallium zinc oxide (IGZO)-based flexible electronics. In particular, appropriate modeling of threshold voltage (VT) changes in different bias and bending conditions is required for reliability-aware simulation in both device and circuit levels. Here, we present SPICE compatible compact modeling of IGZO transistors and inverters having an atomic layer deposition (ALD) Al2O3 gate insulator on a polyethylene terephthalate (PET) substrate. Specifically, the modeling was performed to predict the behavior of the circuit using stretched exponential function (SEF) in a bending radius of 10 mm and operating voltages ranging between 4 and 8 V. The simulation results of the IGZO circuits matched well with the measured values in various operating conditions. It is expected that the proposed method can be applied to process improvement or circuit design by predicting the direct current (DC) and alternating current (AC) responses of flexible IGZO circuits.

On the nature of growth of water trees and electrical aging of cross-linked polyethylene

2002 ◽  
Author(s):  
D.K. Das-Gupta ◽  
A. Svatik ◽  
A. Bulinski ◽  
J. Densley ◽  
S. Bamji ◽  
...  
Keyword(s):  
Electrical Aging
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