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Antirandom vs. pseudorandom testing
Proceedings International Conference on Computer Design. VLSI in Computers and Processors (Cat. No.98CB36273)
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10.1109/iccd.1998.727054
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2002
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Cited By ~ 1
Author(s):
ShenHui Wu
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Y.K. Malaiya
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A.P. Jayasumana
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