Concurrent testing of VLSI circuits using conservative logic

Proceedings., 1990 IEEE International Conference on Computer Design: VLSI in Computers and Processors ◽

10.1109/iccd.1990.130161 ◽

2002 ◽

Cited By ~ 10

Author(s):

G. Swaminathan ◽

J.H. Aylor ◽

B.W. Johnson

Keyword(s):

Vlsi Circuits ◽

Concurrent Testing ◽

Conservative Logic

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An efficient approach to pipeline scheme for concurrent testing of VLSI circuits

[Proceedings] 1992 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.1992.230166 ◽

2003 ◽

Author(s):

C.-I.H. Chen ◽

J. Yuen

Keyword(s):

Vlsi Circuits ◽

Efficient Approach ◽

Concurrent Testing

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A scheme for overlaying concurrent testing of VLSI circuits

Proceedings of the 1989 26th ACM/IEEE conference on Design automation conference - DAC '89 ◽

10.1145/74382.74471 ◽

1989 ◽

Cited By ~ 20

Author(s):

W.-B. Jone ◽

C. A. Papachristou ◽

M. Pereira

Keyword(s):

Vlsi Circuits ◽

Concurrent Testing

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Test pattern generation for logic crosstalk faults in VLSI circuits

IEE Proceedings G Circuits Devices and Systems ◽

10.1049/ip-g-2.1991.0034 ◽

1991 ◽

Vol 138 (2) ◽

pp. 179 ◽

Cited By ~ 3

Author(s):

A. Rubio ◽

J.A. Sainz ◽

K. Kinoshita

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Vlsi Circuits ◽

Test Pattern Generation

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A Fast Power Current Simulation of Cryptographic VLSI Circuits for Side Channel Attack Evaluation

IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences ◽

10.1587/transfun.e96.a.2533 ◽

2013 ◽

Vol E96.A (12) ◽

pp. 2533-2541

Author(s):

Daisuke FUJIMOTO ◽

Toshihiro KATASHITA ◽

Akihiko SASAKI ◽

Yohei HORI ◽

Akashi SATOH ◽

...

Keyword(s):

Vlsi Circuits ◽

Side Channel ◽

Side Channel Attack ◽

Fast Power

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2019 Symposium on VLSI Circuits

10.23919/vlsicircuits46680.2019 ◽

2019 ◽

Keyword(s):

Vlsi Circuits

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2017 Symposium on VLSI Circuits

10.23919/vlsicircuits40788.2017 ◽

2017 ◽

Keyword(s):

Vlsi Circuits

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VLSI Circuits 2019 Short Course

2019 Symposium on VLSI Circuits ◽

10.23919/vlsic.2019.8778188 ◽

2019 ◽

Keyword(s):

Vlsi Circuits ◽

Short Course

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A Novel Output Vector Monitoring Online Concurrent BIST Architecture For VLSI Circuits

i-manager’s Journal on Electronics Engineering ◽

10.26634/jele.1.2.1368 ◽

2011 ◽

Vol 1 (2) ◽

pp. 22-29

Author(s):

Philemon Daniel ◽

Rajeevan Chandel

Keyword(s):

Vlsi Circuits ◽

Output Vector

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DESIGN OF HIGH PERFORMANCE PULSE GENERATOR TO PERFORM AUTOMATIC TEST IN VLSI CIRCUITS

i-manager’s Journal on Electronics Engineering ◽

10.26634/jele.9.3.15953 ◽

2019 ◽

Vol 9 (3) ◽

pp. 26

Author(s):

P. LOKESH ◽

V. THRIMURTHULU ◽

PRIYA L. MIHIRA ◽

◽

...

Keyword(s):

High Performance ◽

Pulse Generator ◽

Vlsi Circuits ◽

Automatic Test

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State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume I. Executive Summary.

10.21236/ada127984 ◽

1982 ◽

Author(s):

M. A. Breuer ◽

Al J. Carlan

Keyword(s):

State Of The Art ◽

Vlsi Circuits ◽

Executive Summary ◽

Art Assessment

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