Trade-off between the control bandwidth and the measurement accuracy in Atomic Force Microscopy

2012 ◽  
Author(s):  
Stefan Kuiper ◽  
Paul Van den Hof ◽  
Georg Schitter
Keyword(s):  
Atomic Force Microscopy ◽  
Measurement Accuracy ◽  
Trade Off ◽  
Force Microscopy ◽  
Atomic Force

Disclosing and overcoming the trade-off between noise and scanning speed in atomic force microscopy

2013 ◽  
Vol 24 (32) ◽  
pp. 325104
Author(s):  
B Torre ◽  
M Basso ◽  
B Tiribilli ◽  
P Paoletti ◽  
M Vassalli
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Speed ◽  
Trade Off ◽  
Force Microscopy ◽  
Atomic Force

Response Measurement Accuracy for Off-Resonance Excitation in Atomic Force Microscopy

2011 ◽  
Vol 134 (1) ◽  
Author(s):  
R. Parker Eason ◽  
Andrew J. Dick
Keyword(s):  
Atomic Force Microscopy ◽  
Measurement Accuracy ◽  
Excitation Frequency ◽  
Operating Conditions ◽  
Laser Spot ◽  
Resonance Excitation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Behavior ◽  
Tip Mass

Displacement measurement in atomic force microscopy (AFM) is most commonly obtained indirectly by measuring the slope of the AFM probe and applying a calibration factor. Static calibration techniques operate on the assumption that the probe response approximates single mode behavior. For off-resonance excitation or different operating conditions the contribution of higher modes may become significant. In this paper, changes to the calibrated slope-displacement relationship and the corresponding implications on measurement accuracy are investigated. A model is developed and numerical simulations are performed to examine the effect of laser spot position, tip mass, quality factor and excitation frequency on measurement accuracy. Free response conditions and operation under nonlinear tip-sample forces are considered. Results are verified experimentally using a representative macroscale system. A laser spot positioned at a nominal position between x = 0.5 and 0.6 is determined to minimize optical lever measurement error under conditions where the response is dominated by contributions from the first two modes, due to excitation as well as other factors.

Response Measurement Accuracy for Off-Resonance Excitation in Atomic Force Microscopy

2010 ◽  
Author(s):  
Andrew J. Dick ◽  
R. Parker Eason
Keyword(s):  
Atomic Force Microscopy ◽  
Fundamental Frequency ◽  
Measurement Accuracy ◽  
Excitation Frequency ◽  
Resonance Excitation ◽  
Response Measurement ◽  
Force Microscopy ◽  
Atomic Force ◽  
Calibration Methods ◽  
Invaluable Tool

Dynamic atomic force microscopy (AFM) is an invaluable tool for characterizing and interacting with micro- and nano-scale systems. Standard measurement methods use a laser beam and a segmented photodiode to monitor the probe’s response. The diode reading is proportional to the slope of the probe and the displacement is obtained indirectly. As most operation methods use excitation around the fundamental frequency, calibration methods for determining the conversion factor to calculate the probe’s displacement are strongly inspired by the first vibrational mode shape. Within this paper, the results of an analytical study to predict measurement accuracy under non-standard excitation conditions with this calibration are presented. The influence of the excitation frequency, damping level, and laser spot location on this accuracy is investigated. The measurement accuracy for excitation at 2.5 times the fundamental frequency is of particular interest to the authors. Based upon the results, the use of a correction factor or a frequency-specific calibration is recommended.

Electrostatic Forces on the Surface of Metals as Measured by Atomic Force Microscopy

2000 ◽  
Vol 10 (1-2) ◽  
pp. 15
Author(s):  
Eugene Sprague ◽  
Julio C. Palmaz ◽  
Cristina Simon ◽  
Aaron Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force
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