Microarchitectural simulation and control of di/dt-induced power supply voltage variation

2004 ◽  
Author(s):  
E. Grochowski ◽  
D. Ayers ◽  
V. Tiwari
Keyword(s):  
Power Supply ◽  
Supply Voltage ◽  
Power Supply Voltage ◽  
Voltage Variation ◽  
Simulation And Control ◽  
Microarchitectural Simulation ◽  
And Control

scholarly journals Experimental FIA Methodology Using Clock and Control Signal Modifications under Power Supply and Temperature Variations

Sensors ◽  
2021 ◽  
Vol 21 (22) ◽  
pp. 7596
Author(s):  
Francisco Eugenio Potestad-Ordóñez ◽  
Erica Tena-Sánchez ◽  
José Miguel Mora-Gutiérrez ◽  
Manuel Valencia-Barrero ◽  
Carlos Jesús Jiménez-Fernández
Keyword(s):  
Power Supply ◽  
Supply Voltage ◽  
Fault Injection ◽  
Short Pulse ◽  
Mathematical Formulation ◽  
Control Signal ◽  
Clock Signal ◽  
Power Supply Voltage ◽  
Injection Attacks ◽  
And Control

The security of cryptocircuits is determined not only for their mathematical formulation, but for their physical implementation. The so-called fault injection attacks, where an attacker inserts faults during the operation of the cipher to obtain a malfunction to reveal secret information, pose a serious threat for security. These attacks are also used by designers as a vehicle to detect security flaws and then protect the circuits against these kinds of attacks. In this paper, two different attack methodologies are presented based on inserting faults through the clock signal or the control signal. The optimization of the attacks is evaluated under supply voltage and temperature variation, experimentally determining the feasibility through the evaluation of different Trivium versions in 90 nm ASIC technology implementations, also considering different routing alternatives. The results show that it is possible to inject effective faults with both methodologies, improving fault efficiency if the power supply voltage decreases, which requires only half the frequency of the short pulse inserted into the clock signal to obtain a fault. The clock signal modification methodology can be extended to other NLFSR-based cryptocircuits and the control signal-based methodology can be applied to both block and stream ciphers.

Study on the Electronic Ignition System Bench on SCM

2012 ◽  
Vol 590 ◽  
pp. 212-215
Author(s):  
Shan Zhen Xu ◽  
Hong Lei Gu ◽  
Cheng Wang
Keyword(s):  
Signal Processing ◽  
Power Supply ◽  
Supply Voltage ◽  
Power Supply Voltage ◽  
Ignition System ◽  
Voltage Signal ◽  
Temperature Signal ◽  
The Moment ◽  
And Control ◽  
Measurement And Control

To enhance the power of the engine and improve the emissions performance, The Intake air temperature signal , knock signal, throttle signal and power supply voltage signal were used as the correction references for the ignition advance angle. According to the parameter characteristics, the schemes of the measurement and control were proposed. The sensors were selected and corresponding parameters were determined. And then parameters of signal processing circuits designed, so that determined the moment of ignition. The experiment proved that the electronic ignition system designed in this paper, can meet the expected demand.

Evaluation of SRAM-Core Susceptibility against Power Supply Voltage Variation

2012 ◽  
Vol E95-C (4) ◽  
pp. 586-593 ◽  
Author(s):  
Takuya SAWADA ◽  
Taku TOSHIKAWA ◽  
Kumpei YOSHIKAWA ◽  
Hidehiro TAKATA ◽  
Koji NII ◽  
...  
Keyword(s):  
Power Supply ◽  
Supply Voltage ◽  
Power Supply Voltage ◽  
Voltage Variation

Power Supply Voltage Dependence of Within-Die Delay Variation of Regular Manual Layout and Irregular Place-and-Route Layout

2011 ◽  
Vol E94-C (6) ◽  
pp. 1072-1075
Author(s):  
Tadashi YASUFUKU ◽  
Yasumi NAKAMURA ◽  
Zhe PIAO ◽  
Makoto TAKAMIYA ◽  
Takayasu SAKURAI
Keyword(s):  
Power Supply ◽  
Voltage Dependence ◽  
Supply Voltage ◽  
Power Supply Voltage ◽  
Place And Route ◽  
Delay Variation

Power Supply Voltage Control for Eliminating Overkills and Underkills in Delay Fault Testing

2016 ◽  
Vol E99.C (10) ◽  
pp. 1219-1225
Author(s):  
Masahiro ISHIDA ◽  
Toru NAKURA ◽  
Takashi KUSAKA ◽  
Satoshi KOMATSU ◽  
Kunihiro ASADA
Keyword(s):  
Power Supply ◽  
Supply Voltage ◽  
Voltage Control ◽  
Fault Testing ◽  
Power Supply Voltage ◽  
Delay Fault ◽  
Delay Fault Testing

AlInAs/GaInAs on InP HEMTs for low power supply voltage operation of high power-added efficiency microwave amplifiers

1993 ◽  
Vol 29 (15) ◽  
pp. 1324 ◽  
Author(s):  
L.E. Larson ◽  
M.M. Matloubian ◽  
J.J. Brown ◽  
A.S. Brown ◽  
M. Thompson ◽  
...  
Keyword(s):  
Low Power ◽  
High Power ◽  
Power Supply ◽  
Supply Voltage ◽  
Power Supply Voltage ◽  
Power Added Efficiency ◽  
Microwave Amplifiers
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