On the comparison of fuzzy interpolation and other interpolation methods in high accuracy measurements

Author(s):  
Ying Bai ◽  
Dali Wang
2012 ◽  
Vol 2012 ◽  
pp. 1-9 ◽  
Author(s):  
Ying Bai ◽  
Nailong Guo ◽  
Gerald Agbegha

A novel interpolation algorithm, fuzzy interpolation, is presented and compared with other popular interpolation methods widely implemented in industrial robots calibrations and manufacturing applications. Different interpolation algorithms have been developed, reported, and implemented in many industrial robot calibrations and manufacturing processes in recent years. Most of them are based on looking for the optimal interpolation trajectories based on some known values on given points around a workspace. However, it is rare to build an optimal interpolation results based on some random noises, and this is one of the most popular topics in industrial testing and measurement applications. The fuzzy interpolation algorithm (FIA) reported in this paper provides a convenient and simple way to solve this problem and offers more accurate interpolation results based on given position or orientation errors that are randomly distributed in real time. This method can be implemented in many industrial applications, such as manipulators measurements and calibrations, industrial automations, and semiconductor manufacturing processes.


Author(s):  
M. Nishigaki ◽  
S. Katagiri ◽  
H. Kimura ◽  
B. Tadano

The high voltage electron microscope has many advantageous features in comparison with the ordinary electron microscope. They are a higher penetrating efficiency of the electron, low chromatic aberration, high accuracy of the selected area diffraction and so on. Thus, the high voltage electron microscope becomes an indispensable instrument for the metallurgical, polymer and biological specimen studies. The application of the instrument involves today not only basic research but routine survey in the various fields. Particularly for the latter purpose, the performance, maintenance and reliability of the microscope should be same as those of commercial ones. The authors completed a 500 kV electron microscope in 1964 and a 1,000 kV one in 1966 taking these points into consideration. The construction of our 1,000 kV electron microscope is described below.


2021 ◽  
Vol 26 (3) ◽  
pp. 05020053
Author(s):  
Jingwei Hou ◽  
Meiyan Zheng ◽  
Moyan Zhu ◽  
Yanjuan Wang

The paper describes the main trends in the development of BIM technologies in the field of restoration and reconstruction of historical and cultural heritage buildings. The practical part of the paper presents the experience in using information modeling technologies when restoring the building, where the VI Congress of the Chinese Communist Party in Moscow took place. The use of laser scanning technologies made it possible to reproduce with high accuracy in the information model the original appearance of the building using Autodesk RevitR software. It is shown, how the use of information modeling technologies affects the duration of restoration process, taking into account the calculation of the structural scheme and bearing structures of the building, ensuring the identity of the decoration and the effective organization of electromechanical installation. Operating in a single BIM information environment makes it possible to continuously obtain reliable information on the project, which provides more effective information interaction and communication of participants compared to using traditional design methods.


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