System of comparison of time scales of distant objects via optical fiber

2017 ◽  
Author(s):  
O.V. Kolmogorov ◽  
S.S. Donchenko ◽  
D.V. Prokhorov
Keyword(s):  
Optical Fiber ◽  
Time Scales ◽  
Comparison Of Time Scales

Using signals of satellite radio navigation systems for comparison of time scales

2001 ◽  
Vol 7 (4) ◽  
pp. 77-82
Author(s):  
H.S. Sydorenko ◽  
◽  
V.S. Solovyov ◽  
A.A. Tkachuk ◽  
O.S. Kleyman ◽  
...  
Keyword(s):  
Time Scales ◽  
Navigation Systems ◽  
Radio Navigation ◽  
Comparison Of Time Scales

Transmission of Timing Sensitive Information Using Photonic Services

2013 ◽  
Vol 321-324 ◽  
pp. 2343-2347
Author(s):  
Josef Vojtech ◽  
Vladimir Smotlacha ◽  
Pavel Skoda
Keyword(s):  
Time Scales ◽  
Data Transmission ◽  
Optical Network ◽  
Network Services ◽  
Sensitive Information ◽  
Photonic Networks ◽  
Transmission Of Information ◽  
New Type ◽  
Comparison Of Time Scales ◽  
Stable Transmission

Present optical network can allow very stable transmission of information. Photonic services represent a new type of multi-domain, end-to-end network services, besides traditional data transmission enables also real-time and non-data transmission over photonic networks. We proved the concept of photonic services on a specialized metrology application - comparison of time scales, where time scales are compared over distance of 1100km.

LVSEM: Past Present and Future

1990 ◽  
Vol 48 (1) ◽  
pp. 364-365
Author(s):  
James B. Pawley
Keyword(s):  
Field Emission ◽  
Line Width ◽  
Time Scales ◽  
Silicon Oxide ◽  
Beam Current ◽  
High Brightness ◽  
High Beam ◽  
Fixed Charges ◽  
Beam Voltage ◽  
Deposited Metal

Past: In 1960 Thornley published the first description of SEM studies carried out at low beam voltage (LVSEM, 1-5 kV). The aim was to reduce charging on insulators but increased contrast and difficulties with low beam current and frozen biological specimens were also noted. These disadvantages prevented widespread use of LVSEM except by a few enthusiasts such as Boyde. An exception was its use in connection with studies in which biological specimens were dissected in the SEM as this process destroyed the conducting films and produced charging unless LVSEM was used.In the 1980’s field emission (FE) SEM’s came into more common use. The high brightness and smaller energy spread characteristic of the FE-SEM’s greatly reduced the practical resolution penalty associated with LVSEM and the number of investigators taking advantage of the technique rapidly expanded; led by those studying semiconductors. In semiconductor research, the SEM is used to measure the line-width of the deposited metal conductors and of the features of the photo-resist used to form them. In addition, the SEM is used to measure the surface potentials of operating circuits with sub-micrometer resolution and on pico-second time scales. Because high beam voltages destroy semiconductors by injecting fixed charges into silicon oxide insulators, these studies must be performed using LVSEM where the beam does not penetrate so far.

Bending loss formulas for step-index optical fiber and their applicable regions

1981 ◽  
Vol 64 (10) ◽  
pp. 95-103
Author(s):  
Kiyonobu Kusano ◽  
Shigeo Nishida
Keyword(s):  
Optical Fiber ◽  
Step Index ◽  
Bending Loss
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