Nondestructive Imaging of Dielectric Objects using Band-Limited Noisy Scattering Data

2001 ◽  
Author(s):  
M. J. Akhtar ◽  
A.S. Omar
Keyword(s):  
Scattering Data ◽  
Nondestructive Imaging ◽  
Band Limited ◽  
Dielectric Objects

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

Entropy determination by scattering data

1994 ◽  
Vol 4 (8) ◽  
pp. 1289-1298
Author(s):  
S. Ciccariello ◽  
Y. Hassan
Keyword(s):  
Scattering Data

Method of estimation of hidden correlation of narrowband noise signals

2019 ◽  
pp. 34-39 ◽  
Author(s):  
E.I. Chernov ◽  
N.E. Sobolev ◽  
A.A. Bondarchuk ◽  
L.E. Aristarhova
Keyword(s):  
Signal Processing ◽  
Digital Signal Processing ◽  
New Technology ◽  
Digital Signal ◽  
Measuring Instruments ◽  
Central Frequency ◽  
Pearson Criterion ◽  
Useful Signal ◽  
Band Limited ◽  
Narrowband Noise

The concept of hidden correlation of noise signals is introduced. The existence of a hidden correlation between narrowband noise signals isolated simultaneously from broadband band-limited noise is theoretically proved. A method for estimating the latent correlation of narrowband noise signals has been developed and experimentally investigated. As a result of the experiment, where a time frag ent of band-limited noise, the basis of which is shot noise, is used as the studied signal, it is established: when applying the Pearson criterion, there is practically no correlation between the signal at the Central frequency and the sum of signals at mirror frequencies; when applying the proposed method for the analysis of the same signals, a strong hidden correlation is found. The proposed method is useful for researchers, engineers and metrologists engaged in digital signal processing, as well as developers of measuring instruments using a new technology for isolating a useful signal from noise – the method of mirror noise images.

Bayesian Inversion of Seabed Scattering Data (Special Research Award in Ocean Acoustics)

2011 ◽  
Author(s):  
Gavin A. Steininger ◽  
Stan E. Dosso ◽  
Jan Dettmer ◽  
Charles W. Holland
Keyword(s):  
Scattering Data ◽  
Bayesian Inversion ◽  
Ocean Acoustics ◽  
Research Award

Bayesian Inversion of Seabed Scattering Data (Special Research Award in Ocean Acoustics)

2012 ◽  
Author(s):  
Gavin A. Steininger ◽  
Stan E. Dosso ◽  
Jan Dettmer ◽  
Charles W. Holland
Keyword(s):  
Scattering Data ◽  
Bayesian Inversion ◽  
Ocean Acoustics ◽  
Research Award

Pushing the Envelope

2018 ◽  
Author(s):  
Eaton E. Lattman ◽  
Thomas D. Grant ◽  
Edward H. Snell
Keyword(s):  
High Resolution ◽  
Electron Density ◽  
Structural Information ◽  
Hydration Shell ◽  
Three Dimensional ◽  
Scattering Data ◽  
Saxs Data ◽  
Electron Density Function ◽  
Angle Scattering ◽  
Iterative Structure

Direct electron density determination from SAXS data opens up new opportunities. The ability to model density at high resolution and the implicit direct estimation of solvent terms such as the hydration shell may enable high-resolution wide angle scattering data to be used to calculate density when combined with additional structural information. Other diffraction methods that do not measure three-dimensional intensities, such as fiber diffraction, may also be able to take advantage of iterative structure factor retrieval. While the ability to reconstruct electron density ab initio is a major breakthrough in the field of solution scattering, the potential of the technique has yet to be fully uncovered. Additional structural information from techniques such as crystallography, NMR, and electron microscopy and density modification procedures can now be integrated to perform advanced modeling of the electron density function at high resolution, pushing the boundaries of solution scattering further than ever before.

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