An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy

12th IEEE European Test Symposium (ETS'07) ◽

10.1109/ets.2007.10 ◽

2007 ◽

Cited By ~ 44

Author(s):

Philipp Ohler ◽

Sybille Hellebrand ◽

Hans-Joachim Wunderlich

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