The use of a test specification format in automatic test program generation

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36264 ◽

2003 ◽

Cited By ~ 11

Author(s):

B. Verhelst

Keyword(s):

Automatic Test ◽

Test Program ◽

Program Generation ◽

Test Specification

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Using a test-specification format in automatic test-program generation

IEEE Design & Test of Computers ◽

10.1109/54.46892 ◽

1990 ◽

Vol 7 (1) ◽

pp. 39-45 ◽

Cited By ~ 3

Author(s):

B. Verhelst

Keyword(s):

Automatic Test ◽

Test Program ◽

Program Generation ◽

Test Specification

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Automatic test program generation for a block oriented VLSI chip design

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36222 ◽

2003 ◽

Cited By ~ 2

Author(s):

F. Hapke

Keyword(s):

Automatic Test ◽

Test Program ◽

Chip Design ◽

Program Generation ◽

Vlsi Chip

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Optimization of access points for automatic test program generation and fault location in large analogue circuits and systems

Microelectronics Reliability ◽

10.1016/s0026-2714(82)80245-x ◽

1982 ◽

Vol 22 (4) ◽

pp. 899-900

Keyword(s):

Fault Location ◽

Automatic Test ◽

Test Program ◽

Access Points ◽

Program Generation ◽

Analogue Circuits

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Automatic test program generation using graphical tools for producing factory and CASS ATLAS test code

AUTOTESTCON 93 ◽

10.1109/autest.1993.396372 ◽

2002 ◽

Author(s):

M.C. Scallan

Keyword(s):

Automatic Test ◽

Test Program ◽

Program Generation

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Fully automatic test program generation for microprocessor cores

2003 Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2003.1253736 ◽

2003 ◽

Cited By ~ 44

Author(s):

F. Corno ◽

G. Cumani ◽

M. Sonza Reorda ◽

G. Squillero

Keyword(s):

Automatic Test ◽

Test Program ◽

Program Generation ◽

Fully Automatic

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AUTOMATIC TEST PROGRAM GENERATION: HOW ARTIFICIAL EVOLUTION MAY OUTPERFORM EXPERIENCE

The Handbook on Reasoning-Based Intelligent Systems ◽

10.1142/9789814329484_0015 ◽

2013 ◽

pp. 389-431

Author(s):

Danilo Ravotto ◽

Ernesto Sanchez ◽

Giovanni Squillero

Keyword(s):

Artificial Evolution ◽

Automatic Test ◽

Test Program ◽

Program Generation

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EmGen: An Automatic Test-Program Generation Tool for Embedded IP Cores

Embedded Software and Systems - Lecture Notes in Computer Science ◽

10.1007/11535409_77 ◽

2005 ◽

pp. 528-535 ◽

Cited By ~ 1

Author(s):

Haihua Shen ◽

Yunji Chen ◽

Jing Huang

Keyword(s):

Automatic Test ◽

Test Program ◽

Program Generation ◽

Ip Cores

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Automatic test program generation: a case study

IEEE Design & Test of Computers ◽

10.1109/mdt.2004.1277902 ◽

2004 ◽

Vol 21 (2) ◽

pp. 102-109 ◽

Cited By ~ 87

Author(s):

F. Corno ◽

E. Sanchez ◽

M.S. Reorda ◽

G. Squillero

Keyword(s):

Automatic Test ◽

Test Program ◽

Program Generation

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Automatic test program generation for analog circuits: The self‐testing approach

Journal of the Chinese Institute of Engineers ◽

10.1080/02533839.1987.9676996 ◽

1987 ◽

Vol 10 (4) ◽

pp. 453-462

Author(s):

Chyun‐Shin Cheng ◽

Yih‐Yih Wu ◽

Da‐Hong Chen ◽

Chwan‐Chia Wu

Keyword(s):

Analog Circuits ◽

The Self ◽

Automatic Test ◽

Test Program ◽

Program Generation ◽

Self Testing ◽

Testing Approach

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Automatic Test Program Generation.

10.21236/ada054910 ◽

1978 ◽

Author(s):

Yung Ko Chang

Keyword(s):

Automatic Test ◽

Test Program ◽

Program Generation

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