Testing multiple power connections with boundary scan

Author(s):  
D. van de Lagemaat
Keyword(s):  
2010 ◽  
Vol 130 (11) ◽  
pp. 1897-1906
Author(s):  
Yoshiyuki Saito ◽  
Masakatsu Yasuhara ◽  
Yuichi Mabuchi ◽  
Tohlu Matsushima ◽  
Takashi Hisakado ◽  
...  

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