Fast submicrometer-scale imaging of whole zebrafish using the knife-edge scanning microscope

2016 ◽  
Author(s):  
Daniel E. Miller ◽  
Raj S. Shah ◽  
Wencong Zhang ◽  
Jaewook Yoo ◽  
Jaerock Kwon ◽  
...  
Keyword(s):  
Knife Edge ◽  
Scanning Microscope

scholarly journals Charting out the octopus connectome at submicron resolution using the knife-edge scanning microscope

2010 ◽  
Vol 11 (S1) ◽  
Author(s):  
Yoonsuck Choe ◽  
Louise C Abbott ◽  
Giovanna Ponte ◽  
John Keyser ◽  
Jaerock Kwon ◽  
...  
Keyword(s):  
Knife Edge ◽  
Scanning Microscope ◽  
Submicron Resolution

scholarly journals Multiscale Exploration of Mouse Brain Microstructures Using the Knife-Edge Scanning Microscope Brain Atlas

2011 ◽  
Vol 5 ◽  
Author(s):  
Ji Ryang Chung ◽  
Chul Sung ◽  
David Mayerich ◽  
Jaerock Kwon ◽  
Daniel E. Miller ◽  
...  
Keyword(s):  
Mouse Brain ◽  
Brain Atlas ◽  
Knife Edge ◽  
Scanning Microscope

Closing the GAP—A 5Å Scanning Microscope

1969 ◽  
Vol 27 ◽  
pp. 6-7
Author(s):  
A. V. Crewe
Keyword(s):  
Normal Form ◽  
The Other ◽  
Resolving Power ◽  
Scanning Microscope ◽  
Conventional Microscope ◽  
Other Hand ◽  
Closing The Gap ◽  
Thermal Sources ◽  
Better Than ◽  
Transmission Microscope

We have become accustomed to differentiating between the scanning microscope and the conventional transmission microscope according to the resolving power which the two instruments offer. The conventional microscope is capable of a point resolution of a few angstroms and line resolutions of periodic objects of about 1Å. On the other hand, the scanning microscope, in its normal form, is not ordinarily capable of a point resolution better than 100Å. Upon examining reasons for the 100Å limitation, it becomes clear that this is based more on tradition than reason, and in particular, it is a condition imposed upon the microscope by adherence to thermal sources of electrons.

A New Image Processing Technique for STEM

1974 ◽  
Vol 32 ◽  
pp. 432-433
Author(s):  
Yasushi Kokubo ◽  
Hirotami Koike ◽  
Teruo Someya
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Scanning Electron Microscopy ◽  
Elastic Scattering ◽  
Field Emission ◽  
Processing Technique ◽  
Image Processing Technique ◽  
Energy Analyzer ◽  
Scanning Microscope ◽  
Scanning Electron

One of the advantages of scanning electron microscopy is the capability for processing the image contrast, i.e., the image processing technique. Crewe et al were the first to apply this technique to a field emission scanning microscope and show images of individual atoms. They obtained a contrast which depended exclusively on the atomic numbers of specimen elements (Zcontrast), by displaying the images treated with the intensity ratio of elastically scattered to inelastically scattered electrons. The elastic scattering electrons were extracted by a solid detector and inelastic scattering electrons by an energy analyzer. We noted, however, that there is a possibility of the same contrast being obtained only by using an annular-type solid detector consisting of multiple concentric detector elements.

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