X-ray simulation with the Monte Carlo code PENELOPE. Application to Quality Control

2012 ◽  
Author(s):  
F. Pozuelo ◽  
S. Gallardo ◽  
A. Querol ◽  
G. Verdu ◽  
J. Rodenas
Keyword(s):  
Quality Control ◽  
Monte Carlo ◽  
Monte Carlo Code ◽  
X Ray

scholarly journals FRED: a fast Monte Carlo code on GPU for quality control in Particle Therapy

2020 ◽  
Vol 1548 ◽  
pp. 012020
Author(s):  
M De Simoni ◽  
M Fischetti ◽  
E Gioscio ◽  
M Marafini ◽  
R Mirabelli ◽  
...  
Keyword(s):  
Quality Control ◽  
Monte Carlo ◽  
Particle Therapy ◽  
Monte Carlo Code

X-Ray Microanalysis Combined with Monte Carlo Simulation for the Analysis of Layered Thin Films: The Case of Carbon Contamination

2009 ◽  
Vol 15 (2) ◽  
pp. 99-105 ◽  
Author(s):  
Aldo Armigliato ◽  
Rodolfo Rosa
Keyword(s):  
Monte Carlo ◽  
Carbon Film ◽  
Sample Surface ◽  
Scanning Transmission Electron Microscope ◽  
Carbon Layer ◽  
Monte Carlo Code ◽  
X Ray ◽  
Transmission Electron ◽  
The Monte Carlo Method ◽  
Scanning Transmission

AbstractA previously developed Monte Carlo code has been extended to the X-ray microanalysis in a (scanning) transmission electron microscope of plan sections, consisting of bilayers and triple layers. To test the validity of this method for quantification purposes, a commercially available NiOx (x ∼ 1) thin film, deposited on a carbon layer, has been chosen. The composition and thickness of the NiO film and the thickness of the C support layer are obtained by fitting to the three X-ray intensity ratios I(NiK)/I(OK), I(NiK)/I(CK), and I(OK)/I(CK). Moreover, it has been investigated to what extent the resulting film composition is affected by the presence of a contaminating carbon film at the sample surface. To this end, the sample has been analyzed both in the (recommended) “grid downward” geometry and in the upside/down (“grid upward”) situation. It is found that a carbon contaminating film of few tens of nanometers must be assumed in both cases, in addition to the C support film. Consequently, assuming the proper C/NiOx/C stack in the simulations, the Monte Carlo method yields the correct oxygen concentration and thickness of the NiOx film.

scholarly journals Characterization of laser-driven electron and photon beams using the Monte Carlo code FLUKA

2014 ◽  
Vol 32 (2) ◽  
pp. 233-241 ◽  
Author(s):  
F. Fiorini ◽  
D. Neely ◽  
R.J. Clarke ◽  
S. Green
Keyword(s):  
Monte Carlo ◽  
Electron Temperature ◽  
Spectral Characteristics ◽  
Simulation Method ◽  
Target Thickness ◽  
Monte Carlo Code ◽  
X Rays ◽  
Photon Beams ◽  
X Ray ◽  
Plasma Effects

AbstractWe present a new simulation method to predict the maximum possible yield of X-rays produced by electron beams accelerated by petawatt lasers irradiating thick solid targets. The novelty of the method lies in the simulation of the electron refiluxing inside the target implemented with the Monte Carlo code Fluka. The mechanism uses initial theoretical electron spectra, cold targets and refiluxing electrons forced to re-enter the target iteratively. Collective beam plasma effects are not implemented in the simulation. Considering the maximum X-ray yield obtained for a given target thickness and material, the relationship between the irradiated target mass thickness and the initial electron temperature is determined, as well as the effect of the refiluxing on X-ray yield. The presented study helps to understand which electron temperature should be produced in order to generate a particular X-ray beam. Several applications, including medical and security imaging, could benefit from laser generated X-ray beams, so an understanding of the material and the thickness maximizing the yields or producing particular spectral characteristics is necessary. On the other more immediate hand, if this study is experimentally reproduced at the beginning of an experiment in which there is an interest in laser-driven electron and/or photon beams, it can be used to check that the electron temperature is as expected according to the laser parameters.

Analysis of shielding materials in a Compton spectrometer applied to x-ray tube quality control using Monte Carlo simulation

2005 ◽  
Vol 115 (1-4) ◽  
pp. 375-379 ◽  
Author(s):  
S. Gallardo ◽  
J. Ródenas ◽  
G. Verdú ◽  
J. I. Villaescusa
Keyword(s):  
Monte Carlo Simulation ◽  
Quality Control ◽  
Monte Carlo ◽  
X Ray ◽  
Tube Quality

Angular Distribution and Polarization of the Continuum Emission in Plasmas with Toroidal Symmetry

1988 ◽  
Vol 102 ◽  
pp. 223-225
Author(s):  
M. Lamoureux ◽  
J. Jacquet ◽  
R.H. Pratt
Keyword(s):  
Monte Carlo ◽  
Radiative Recombination ◽  
Distribution Functions ◽  
Tokamak Plasma ◽  
Degree Of Polarization ◽  
Continuum Emission ◽  
Monte Carlo Code ◽  
Superthermal Electrons ◽  
X Ray ◽  
The Continuum

AbstractSuperthermal electrons in plasmas are usually strongly directional, and this confers angular dependence and polarization to the X-ray continuum radiation emitted. Here, we give the relations between the anisotropic distribution functions f(v,θ) and the degree of polarization of the emission due to direct radiative recombination and bremsstrahlung. An application is then made to a tokamak plasma whose f(v,θ) we obtained from a Monte Carlo code.

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