Gold thin film viscoelastic losses of a length extension mode resonator

2016 ◽  
Author(s):  
Beatrice Bourgeteau-Verlhac ◽  
Raphael Levy ◽  
Thomas Perrier ◽  
Pierre Lavenus ◽  
Jean Guerard ◽  
...  
Keyword(s):  
Thin Film ◽  
Gold Thin Film ◽  
Mode Resonator

On the role of tin underlays for the prevention of thermal grooving in thin gold films

1986 ◽  
Vol 44 ◽  
pp. 732-733
Author(s):  
Jin Young Kim ◽  
R. E. Hummel ◽  
R. T. DeHoff
Keyword(s):  
Thin Film ◽  
Free Surface ◽  
Grain Boundary ◽  
Beneficial Effect ◽  
Failure Mechanism ◽  
Failure Mechanisms ◽  
Distinct Advantage ◽  
Gold Films ◽  
Gold Thin Film

Gold thin film metallizations in microelectronic circuits have a distinct advantage over those consisting of aluminum because they are less susceptible to electromigration. When electromigration is no longer the principal failure mechanism, other failure mechanisms caused by d.c. stressing might become important. In gold thin-film metallizations, grain boundary grooving is the principal failure mechanism.Previous studies have shown that grain boundary grooving in gold films can be prevented by an indium underlay between the substrate and gold. The beneficial effect of the In/Au composite film is mainly due to roughening of the surface of the gold films, redistribution of indium on the gold films and formation of In2O3 on the free surface and along the grain boundaries of the gold films during air annealing.

scholarly journals Molecular Dynamics study on size dependencies of melting dynamics in Gold thin film

2021 ◽  
Vol 1098 (6) ◽  
pp. 062062
Author(s):  
R Fahdiran ◽  
I Sugihartono ◽  
E Handoko ◽  
E Budi ◽  
A B Susila ◽  
...  
Keyword(s):  
Thin Film ◽  
Molecular Dynamics ◽  
Gold Thin Film ◽  
Melting Dynamics

Photoinduced Patterning of Gold Thin Film

2004 ◽  
Vol 43 (No. 8B) ◽  
pp. L1078-L1080
Author(s):  
Ilsin An ◽  
Deokkyeong Seong ◽  
Hyekeun Oh
Keyword(s):  
Thin Film ◽  
Gold Thin Film

Correlation between plasma expansion dynamics and gold-thin film structure during pulsed-laser deposition

2002 ◽  
Vol 80 (10) ◽  
pp. 1716-1718 ◽  
Author(s):  
Eric Irissou ◽  
Boris Le Drogoff ◽  
Mohamed Chaker ◽  
Daniel Guay
Keyword(s):  
Thin Film ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Film Structure ◽  
Laser Deposition ◽  
Plasma Expansion ◽  
Thin Film Structure ◽  
Gold Thin Film

scholarly journals Hardening and Optimizing of the Black Gold Thin Film as the Absorption Layer for Infrared Detector

2013 ◽  
Vol 03 (02) ◽  
pp. 281-283 ◽  
Author(s):  
Dong-pei Qian ◽  
Chuan-gui Wu ◽  
Yao Shuai ◽  
Wen-bo Luo ◽  
Qiang-xiang Peng ◽  
...  
Keyword(s):  
Thin Film ◽  
Infrared Detector ◽  
Absorption Layer ◽  
Gold Thin Film

Nano-patterning of gold thin film by thermal annealing combined with laser interference techniques

2016 ◽  
Vol 122 (4) ◽  
Author(s):  
Minh Thanh Do ◽  
Quang Cong Tong ◽  
Alexander Lidiak ◽  
Mai Hoang Luong ◽  
Isabelle Ledoux-Rak ◽  
...  
Keyword(s):  
Thin Film ◽  
Thermal Annealing ◽  
Laser Interference ◽  
Gold Thin Film ◽  
Nano Patterning

scholarly journals Strain mapping on gold thin film buckling and silicon blistering

2005 ◽  
Vol 875 ◽  
Author(s):  
P. Goudeau ◽  
N. Tamura ◽  
G. Parry ◽  
J. Colin ◽  
C. Coupeau ◽  
...  
Keyword(s):  
Thin Film ◽  
X Ray Diffraction ◽  
Crystal Surfaces ◽  
Strain Mapping ◽  
Strain Fields ◽  
Single Crystal Surfaces ◽  
X Ray ◽  
Gold Thin Film ◽  
Compressive Stresses ◽  
Strain Stress

AbstractStress/Strain fields associated with thin film buckling induced by compressive stresses or blistering due to the presence of gas bubbles underneath single crystal surfaces are difficult to measure owing to the microscale dimensions of these structures. In this work, we show that micro Scanning X-ray diffraction is a well suited technique for mapping the strain/stress tensor of these damaged structures.

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