Total Internal Reflection Fluorescence Microscopy for Investigation of Dynamics of Single Molecules

2018 ◽  
Author(s):  
Ekaterina Savchenko ◽  
Olga Kuznetsova
Keyword(s):  
Fluorescence Microscopy ◽  
Total Internal Reflection ◽  
Single Molecules ◽  
Internal Reflection ◽  
Total Internal Reflection Fluorescence

scholarly journals Three-dimensional total-internal reflection fluorescence nanoscopy with nanometric axial resolution by photometric localization of single molecules

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Alan M. Szalai ◽  
Bruno Siarry ◽  
Jerónimo Lukin ◽  
David J. Williamson ◽  
Nicolás Unsain ◽  
...  
Keyword(s):  
Single Molecule ◽  
Total Internal Reflection ◽  
Single Molecules ◽  
Fluorescence Microscope ◽  
Internal Reflection ◽  
Total Internal Reflection Fluorescence ◽  
Axial Position ◽  
Localization Microscopy ◽  
Localization Precision ◽  
Single Molecule Localization Microscopy

AbstractSingle-molecule localization microscopy enables far-field imaging with lateral resolution in the range of 10 to 20 nanometres, exploiting the fact that the centre position of a single-molecule’s image can be determined with much higher accuracy than the size of that image itself. However, attaining the same level of resolution in the axial (third) dimension remains challenging. Here, we present Supercritical Illumination Microscopy Photometric z-Localization with Enhanced Resolution (SIMPLER), a photometric method to decode the axial position of single molecules in a total internal reflection fluorescence microscope. SIMPLER requires no hardware modification whatsoever to a conventional total internal reflection fluorescence microscope and complements any 2D single-molecule localization microscopy method to deliver 3D images with nearly isotropic nanometric resolution. Performance examples include SIMPLER-direct stochastic optical reconstruction microscopy images of the nuclear pore complex with sub-20 nm axial localization precision and visualization of microtubule cross-sections through SIMPLER-DNA points accumulation for imaging in nanoscale topography with sub-10 nm axial localization precision.

scholarly journals Fast high-resolution 3D total internal reflection fluorescence microscopy by incidence angle scanning and azimuthal averaging

2014 ◽  
Vol 111 (48) ◽  
pp. 17164-17169 ◽  
Author(s):  
Jérôme Boulanger ◽  
Charles Gueudry ◽  
Daniel Münch ◽  
Bertrand Cinquin ◽  
Perrine Paul-Gilloteaux ◽  
...  
Keyword(s):  
High Resolution ◽  
Fluorescence Microscopy ◽  
Total Internal Reflection ◽  
Incidence Angle ◽  
Internal Reflection ◽  
Total Internal Reflection Fluorescence
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