scholarly journals A novel technique to measure propagation loss of optical waveguides

Author(s):  
S. Barai ◽  
A. Selvarajan ◽  
T. Srinivas ◽  
T. Madhan ◽  
R. Fazludeen
2005 ◽  
Vol 17 (2) ◽  
pp. 360-362 ◽  
Author(s):  
R. Fazludeen ◽  
S. Barai ◽  
P.K. Pattnaik ◽  
T. Srinivas ◽  
A. Selvarajan

1990 ◽  
Vol 56 (11) ◽  
pp. 990-992 ◽  
Author(s):  
M. Seto ◽  
A. Shahar ◽  
R. J. Deri ◽  
W. J. Tomlinson ◽  
A. Yi‐Yan

2017 ◽  
Vol 72 ◽  
pp. 626-631 ◽  
Author(s):  
B. Sotillo ◽  
A. Chiappini ◽  
V. Bharadwaj ◽  
M. Ramos ◽  
T.T. Fernandez ◽  
...  

1989 ◽  
Vol 152 ◽  
Author(s):  
Uma Ramabadran ◽  
Gregory N. De Brabander ◽  
Joseph T. Boyd ◽  
Howard E. Jackson ◽  
S. Sriram

ABSTRACTRapid thermal annealing has been used to initiate diffusion of Ti in LiNbO3 for the fabrication of optical waveguides. The sample with the most rapid initial ramp of temperature to 875 C was found to have the lowest propagation loss of 1 dB/cm. In order to more fully understand these channel waveguides, we have utilized Raman microprobe spectroscopy. Preliminary results suggest that the presence of the Ti in the LiNbO3 lattice dramatically alters the Raman response.


1995 ◽  
Vol 7 (1) ◽  
pp. 57-58
Author(s):  
Masaki Sawada ◽  
Moriaki Wakaki ◽  
Hiroshi Yoshida

1991 ◽  
Vol 244 ◽  
Author(s):  
G T Reed ◽  
A G Rickman ◽  
B L Weiss ◽  
F Namavar ◽  
E Cortesi ◽  
...  

ABSTRACTResults are presented for the propagation loss of planar optical waveguides fabricated in SIMOX structures with Si overlayers whose thickness varies from 0.57 μm to 6.0 μm. The results demonstrate that thick Si overlayers are required to produce propagation losses below 1 dB/cm. In addition, the results of the coupling between two vertically integrated waveguides formed using two buried SiO2 layers are also reported.


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