Characterization of interfaces involving electrically conductive adhesives using electron-beam moire and infrared microscopy

Author(s):  
A.J. Slifka ◽  
E.S. Drexler
2012 ◽  
Vol 27 ◽  
pp. 676-679 ◽  
Author(s):  
U. Eitner ◽  
T. Geipel ◽  
S.-N. Holtschke ◽  
M. Tranitz

2015 ◽  
Vol 51 (s1) ◽  
pp. 274-278 ◽  
Author(s):  
Christoph Mette ◽  
Elisabeth Stammen ◽  
Klaus Dilger

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