Structure-dependent reliability assessment of 1.3 μm InGaAsP/InP uncooled laser diodes by accelerated aging test
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2006 ◽
Vol 20
(10)
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pp. 141-150
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2020 ◽
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2013 ◽
Vol 35
(4)
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pp. 449-456
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2018 ◽
Vol 12
(03)
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pp. 444-448
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