Comparison of Impedance Measurement Techniques for Extracting Parasitic Inductance of SiC MOSFETs
2014 ◽
Vol 135
(4)
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pp. 2302-2302
2015 ◽
Vol 138
(4)
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pp. 2279-2290
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2018 ◽
Vol 67
(4)
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pp. 912-924
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1952 ◽
Vol 1
(1)
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pp. 148-152
1994 ◽
Vol 45
(10)
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pp. 1015-1020
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