On the yield of compiler-based eSRAMs

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347820 ◽

2004 ◽

Cited By ~ 8

Author(s):

X. Wang ◽

M. Ottavi ◽

F. Meyer ◽

F. Lombardi

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