Surface Flashover on Printed Circuit Boards in Vacuum under Electron Beam Irradiation

2006 ◽  
Author(s):  
H. Fujii ◽  
I. Kanja ◽  
T. Hasegawa ◽  
H. Osuga ◽  
K. Matsui
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Printed Circuit Boards ◽  
Circuit Boards ◽  
Beam Irradiation ◽  
Printed Circuit ◽  
Surface Flashover

DC surface flashover characteristics of polyimide in vacuum under electron beam irradiation

2015 ◽  
Vol 22 (1) ◽  
pp. 604-610 ◽  
Author(s):  
Zhen-Jun Zhang ◽  
Xiao-Quan Zheng ◽  
Jiang Wu ◽  
Wen-Bin Wu ◽  
Pei Yang ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Surface Flashover

Surface flashover performance of epoxy resin microcomposites improved by electron beam irradiation

2017 ◽  
Vol 406 ◽  
pp. 39-45 ◽  
Author(s):  
Yin Huang ◽  
Daomin Min ◽  
Shengtao Li ◽  
Zhen Li ◽  
Dongri Xie ◽  
...  
Keyword(s):  
Electron Beam ◽  
Epoxy Resin ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Surface Flashover

Surface Flashover on Epoxy-Resin Printed Circuit Boards in Vacuum under Electron Irradiation

2010 ◽  
Vol 130 (9) ◽  
pp. 811-817
Author(s):  
Haruhisa Fujii ◽  
Taketoshi Hasegawa ◽  
Hiroyuki Osuga ◽  
Katsuaki Matsui
Keyword(s):  
Epoxy Resin ◽  
Electron Irradiation ◽  
Printed Circuit Boards ◽  
Circuit Boards ◽  
Printed Circuit ◽  
Surface Flashover

Influence of electron beam irradiation on DC surface flashover of polyimide in vacuum

2017 ◽  
Vol 24 (2) ◽  
pp. 1288-1294 ◽  
Author(s):  
Shengtao Li ◽  
Shaoming Pan ◽  
Guochang Li ◽  
Daomin Min ◽  
Weiwang Wang ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Surface Flashover

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

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