High frequency noise characterization of BiCMOS transistors over temperature
Keyword(s):
2018 ◽
Vol 66
(12)
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pp. 5169-5175
Keyword(s):
Keyword(s):
2020 ◽
Vol 68
(6)
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pp. 2116-2123
Keyword(s):
Keyword(s):
2008 ◽
Vol 27
(9)
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pp. 1684-1688
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