Intermittent scan chain fault diagnosis based on signal probability analysis

2004 ◽  
Author(s):  
Yu Huang ◽  
Wu-Tung Cheng ◽  
Cheng-Ju Hsieh ◽  
Huan-Yung Tseng ◽  
Alou Huang ◽  
...  
Keyword(s):  
Fault Diagnosis ◽  
Probability Analysis ◽  
Signal Probability ◽  
Scan Chain

BIST-Based Method for Diagnosing Multiple Faulty CLBs in FPGAs

2014 ◽  
Vol 643 ◽  
pp. 243-248 ◽  
Author(s):  
Guo Hua Wang ◽  
Jing Lin Sun
Keyword(s):  
Fault Diagnosis ◽  
Fault Detection ◽  
Fault Injection ◽  
Memory Block ◽  
Self Test ◽  
Fault Masking ◽  
Scan Chain ◽  
Diagnostic Resolution ◽  
Testing Patterns ◽  
Injection Experiment

This paper presents a new built-in self-test (BIST) method to realize the fault detection and the fault diagnosis of configurable logic blocks (CLBs) in FPGAs. The proposed BIST adopts a circular comparison structure to overcome the phenomenon of fault masking in diagnosing multiple faulty CLBs and improve the diagnostic resolution. To test the memory block in every CLB, different TPG structures are proposed to obtain maximum stuck-at fault coverage. For the LUT mode of the memory block, the TPG based on the LFSR is designed to provide Pseudo-exhaustive testing patterns, and for the distributed RAM mode of the memory block, the TPG based on FSM is designed to provide March C-testing patterns. Besides, the comparator-based output response analyzer (ORA) and the cascaded ORA scan chain are used to locate the faulty CLB and propagate the comparison output in every row. Finally, fault-injection experiment results verify its ability to detect and diagnose multiple faulty CLBs in faulty FPGAs.

Probability Analysis of Fault Diagnosis Performance for Satellite Attitude Control Systems

2019 ◽  
Vol 15 (11) ◽  
pp. 5867-5876 ◽  
Author(s):  
Maiying Zhong ◽  
Chengrui Liu ◽  
Donghua Zhou ◽  
Wenbo Li ◽  
Ting Xue
Keyword(s):  
Fault Diagnosis ◽  
Control Systems ◽  
Attitude Control ◽  
Probability Analysis ◽  
Satellite Attitude ◽  
Satellite Attitude Control

Nonlinear Dynamic Compensation for Probability Analysis in Fault Diagnosis of Electric Equipment

2014 ◽  
Vol 494-495 ◽  
pp. 913-916
Author(s):  
Hao Yang Cui ◽  
Yong Peng Xu ◽  
Jia Lin Wang ◽  
Nai Yun Tang ◽  
Feng Hong Chu ◽  
...  
Keyword(s):  
Fault Diagnosis ◽  
Nonlinear Dynamic ◽  
Characteristic Temperature ◽  
Strong Relationship ◽  
Probability Analysis ◽  
Threshold Temperature ◽  
Maximum Probability ◽  
Dynamic Compensation ◽  
Electric Equipment ◽  
Diagnosis Method

A nonlinear dynamic compensation for probability analysis in fault diagnosis of electric equipment was reported. Because of the limitations of Threshold temperature diagnosis method and the traditional Bayesian theory fault diagnosis method of electric equipment, a nonlinear SGompertz model and quadratic power model were used to compensate the diagnosis results for the influence of equipment aging and running temperature, then the maximum probability principle was adapted to judge whether the equipment is in malfunctioning state. The 3-D simulation results indicates that: (1) there is a strong relationship between the status and equipment aging and running temperature; (2) an obviously difference exists between linear and nonlinear compensational results of the characteristic temperature region. This proposed methodology is testified having important significance in improving the reliability and the information level of power transformers operation.

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