Estimating Markov Modulated Software Reliability Models via EM Algorithm

2006 ◽  
Author(s):  
Takao Ando ◽  
Hiroyuki Okamura ◽  
Tadashi Dohi
Keyword(s):  
Em Algorithm ◽  
Software Reliability ◽  
Reliability Models ◽  
Software Reliability Models ◽  
Markov Modulated

scholarly journals Application of EM Algorithm to NHPP-Based Software Reliability Assessment with Generalized Failure Count Data

Mathematics ◽  
2021 ◽  
Vol 9 (9) ◽  
pp. 985
Author(s):  
Hiroyuki Okamura ◽  
Tadashi Dohi
Keyword(s):  
Em Algorithm ◽  
Software Reliability ◽  
Count Data ◽  
Failure Time ◽  
Estimation Algorithm ◽  
Model Parameters ◽  
Time Data ◽  
Reliability Models ◽  
Failure Data ◽  
Software Reliability Models

Software reliability models (SRMs) are widely used for quantitative evaluation of software reliability by estimating model parameters from failure data observed in the testing phase. In particular, non-homogeneous Poisson process (NHPP)-based SRMs are the most popular because of their mathematical tractability. In this paper, we focus on the parameter estimation algorithm for NHPP-based SRMs and discuss the EM algorithm for generalized fault count data. The presented algorithm can be applied for failure time data, failure count data, and their mixture. The paper derives the EM-step formulas for basic 12 NHPP-based SRMs and demonstrate a numerical experiment to present the convergence property of our algorithms. The developed algorithms are suitable for an automatic tool for software reliability evaluation.

Unification of Software Reliability Models by Self-Exciting Point Processes

1997 ◽  
Vol 29 (2) ◽  
pp. 337-352 ◽  
Author(s):  
Yiping Chen ◽  
Nozer D. Singpurwalla
Keyword(s):  
Software Reliability ◽  
Point Processes ◽  
Computer Software ◽  
Probability Models ◽  
Reliability Models ◽  
Common Structure ◽  
Software Reliability Models ◽  
Special Cases ◽  
Active Debate ◽  
The Subject

Assessing the reliability of computer software has been an active area of research in computer science for the past twenty years. To date, well over a hundred probability models for software reliability have been proposed. These models have been motivated by seemingly unrelated arguments and have been the subject of active debate and discussion. In the meantime, the search for an ideal model continues to be pursued. The purpose of this paper is to point out that practically all the proposed models for software reliability are special cases of self-exciting point processes. This perspective unifies the very diverse approaches to modeling reliability growth and provides a common structure under which problems of software reliability can be discussed.

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