Proactive Channel Adjustment to Improve Polar Code Capability for Flash Storage Devices

Author(s):  
Kun-Cheng Hsu ◽  
Che-Wei Tsao ◽  
Yuan-Hao Chang ◽  
Tei-Wei Kuo ◽  
Yu-Ming Huang
Sensors ◽  
2020 ◽  
Vol 20 (10) ◽  
pp. 2952 ◽  
Author(s):  
Seung-Ho Lim ◽  
Ki-Woong Park

NAND flash memory-based storage devices are vulnerable to errors induced by NAND flash memory cells. Error-correction codes (ECCs) are integrated into the flash memory controller to correct errors in flash memory. However, since ECCs show inherent limits in checking the excessive increase in errors, a complementary method should be considered for the reliability of flash storage devices. In this paper, we propose a scheme based on lossless data compression that enhances the error recovery ability of flash storage devices, which applies to improve recovery capability both of inside and outside the page. Within a page, ECC encoding is realized on compressed data by the adaptive ECC module, which results in a reduced code rate. From the perspective of outside the page, the compressed data are not placed at the beginning of the page, but rather is placed at a specific location within the page, which makes it possible to skip certain pages during the recovery phase. As a result, the proposed scheme improves the uncorrectable bit error rate (UBER) of the legacy system.


Author(s):  
Cheng Ji ◽  
Li-Pin Chang ◽  
Chao Wu ◽  
Liang Shi ◽  
Chun Jason Xue

Author(s):  
Tzu-Jung Huang ◽  
Chien-Chung Ho ◽  
Po-Chun Huang ◽  
Yuan-Hao Chang ◽  
Che-Wei Chang ◽  
...  

2017 ◽  
Vol 63 (1) ◽  
pp. 77-84 ◽  
Author(s):  
Usman Anwar ◽  
Joon-Young Paik ◽  
Rize Jin ◽  
Tae-Sun Chung

2019 ◽  
Vol E102.D (8) ◽  
pp. 1576-1580
Author(s):  
Yongju SONG ◽  
Sungkyun LEE ◽  
Dong Hyun KANG ◽  
Young Ik EOM

Author(s):  
Ming-Chang Yang ◽  
Yuan-Hao Chang ◽  
Yuan-Hung Kuan ◽  
Che-Wei Tsao

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