Edge Detection and Linking Pattern Analysis Using Markov Chains

Author(s):  
Haklin Kimm ◽  
Neda Abolhassani ◽  
Fenglien Lee
Author(s):  
MAO-JIUN J. WANG ◽  
SHIAU-CHYI CHANG ◽  
CHIH-MING LIU ◽  
WEN-YEN WU

This paper reviews some gradient edge detection methods and proposes a new detector — the template matching edge detector (TMED). This detector utilizes the concepts of pattern analysis and the template matching of 3×3 masks. A set of performance criteria was used to evaluate the gradient edge detectors as well as the template matching edge detector. The results indicate that the new method is superior to the other gradient edge detectors. In addition, the template matching edge detector has also demonstrated good performance on noisy images. It can obtain very precise edge detection of single pixel width.


Author(s):  
S.F. Stinson ◽  
J.C. Lilga ◽  
M.B. Sporn

Increased nuclear size, resulting in an increase in the relative proportion of nuclear to cytoplasmic sizes, is an important morphologic criterion for the evaluation of neoplastic and pre-neoplastic cells. This paper describes investigations into the suitability of automated image analysis for quantitating changes in nuclear and cytoplasmic cross-sectional areas in exfoliated cells from tracheas treated with carcinogen.Neoplastic and pre-neoplastic lesions were induced in the tracheas of Syrian hamsters with the carcinogen N-methyl-N-nitrosourea. Cytology samples were collected intra-tracheally with a specially designed catheter (1) and stained by a modified Papanicolaou technique. Three cytology specimens were selected from animals with normal tracheas, 3 from animals with dysplastic changes, and 3 from animals with epidermoid carcinoma. One hundred randomly selected cells on each slide were analyzed with a Bausch and Lomb Pattern Analysis System automated image analyzer.


Author(s):  
R.P. Goehner ◽  
W.T. Hatfield ◽  
Prakash Rao

Computer programs are now available in various laboratories for the indexing and simulation of transmission electron diffraction patterns. Although these programs address themselves to the solution of various aspects of the indexing and simulation process, the ultimate goal is to perform real time diffraction pattern analysis directly off of the imaging screen of the transmission electron microscope. The program to be described in this paper represents one step prior to real time analysis. It involves the combination of two programs, described in an earlier paper(l), into a single program for use on an interactive basis with a minicomputer. In our case, the minicomputer is an INTERDATA 70 equipped with a Tektronix 4010-1 graphical display terminal and hard copy unit.A simplified flow diagram of the combined program, written in Fortran IV, is shown in Figure 1. It consists of two programs INDEX and TEDP which index and simulate electron diffraction patterns respectively. The user has the option of choosing either the indexing or simulating aspects of the combined program.


Author(s):  
Michael K. Kundmann ◽  
Ondrej L. Krivanek

Parallel detection has greatly improved the elemental detection sensitivities attainable with EELS. An important element of this advance has been the development of differencing techniques which circumvent limitations imposed by the channel-to-channel gain variation of parallel detectors. The gain variation problem is particularly severe for detection of the subtle post-threshold structure comprising the EXELFS signal. Although correction techniques such as gain averaging or normalization can yield useful EXELFS signals, these are not ideal solutions. The former is a partial throwback to serial detection and the latter can only achieve partial correction because of detector cell inhomogeneities. We consider here the feasibility of using the difference method to efficiently and accurately measure the EXELFS signal.An important distinction between the edge-detection and EXELFS cases lies in the energy-space periodicities which comprise the two signals. Edge detection involves the near-edge structure and its well-defined, shortperiod (5-10 eV) oscillations. On the other hand, EXELFS has continuously changing long-period oscillations (∼10-100 eV).


2001 ◽  
Vol 13 (s1) ◽  
pp. S2-S5 ◽  
Author(s):  
Shinji Tanaka ◽  
Ken Haruma ◽  
Shinji Nagata ◽  
Shiro Oka ◽  
Kazuaki Chayama

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